Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
On the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability
5.0 out of 5 stars
03 Oct 2005 | Online Presentations | Contributor(s): Muhammad A. Alam
In 1930s Bell Labs scientists chose to focus on Siand Ge, rather than better known semiconductors like Ag2S and Cu2S, mostly because of their reliable performance. Their choice was rewarded with...
Self-Heating and Scaling of Silicon Nano-Transistors
07 Mar 2005 | Online Presentations | Contributor(s): Eric Pop
The most often cited technological roadblock of nanoscale electronics is the "power problem," i.e. power densities and device temperatures reaching levels that will prevent their reliable...