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Synthesis and Characterization of CdSe Qunatum Dots
11 Jan 2017 | | Contributor(s):: Nicholas Blake
In this laboratory, students will study how surfactant-based chemistry can be used to synthesize CdSe quantum dots and study how the size of the quantum dots can be controlled by varying reaction time. The laboratory will demonstrate how the color of these quantum dots can be connected to...
Silver Nanoparticle Synthesis, Spectroscopy, and Bacterial Growth
11 Jan 2017 | | Contributor(s):: Pennsylvania State University
Students will learn about the differences in physical propoerties at the nanoscale as compared to the same materials at the macroscale. The students will demonstrate the appropriate use of a spectrophotometer and will convert between different units of measurement. This unit assists students in...
Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
[Illinois] AMC 2016 workshop: An introduction to elemental analysis by ED-XRF and an overview of its applications to materials characterization laboratories
13 Jun 2016 | | Contributor(s):: Justin Masone
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
[Illinois] Advanced Materials Characterization Workshop 2015
19 Aug 2015 | | Contributor(s):: Ted Limpoco, Scott Speakman, Timothy P. Spila, Rick Haasch, Justin Masone, Kathy Walsh, Matthew Bresin
AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures covered basic and advanced topics geared towards both novice and experienced scientists.Sessions focused on...
New Frontiers in Terahertz Technology
13 May 2015 | | Contributor(s):: Mona Jarrahi
In this talk, I will describe some of our recent results on developing fundamentally new terahertz electronic/optoelectronic components and imaging/spectrometry architectures to mitigate performance limitations of existing terahertz systems.
[Illinois] Modeling and Characterization of Anisotropic Objects by Volume Integral Equation Methods
10 Mar 2015 | | Contributor(s):: Lin Sun
06 Mar 2015 | | Contributor(s):: NanomaterialRegistry
View, visualize and download data using IDENT, the Interactive Data Exploration and Navigation Tool.
20 Jan 2015 | | Contributor(s):: Lin Sun
[Illinois] Got Milk?: Characterization, Synthesis and Utilization of Human Milk Oligosaccharides
04 Feb 2014 | | Contributor(s):: Michael Miller
Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles
20 Apr 2012 | | Contributor(s):: Trisha Eustaquio
This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered and natural nanoparticles. In terms of engineered nanoparticles, the role of nanoparticle size in...
Malvern Instruments Workshop: Nano-particle Characterization Symposium
11 Apr 2012 | | Contributor(s):: James Leary
The key focus of the symposium is to demonstrate how different analytical techniques provide the information needed to advance nanotechnology.
Theory and characterization of random defect formation and its implication in variability of nanoscale transistors
30 Sep 2011 | | Contributor(s):: Ahmad Ehteshamul Islam
Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of the basic building blocks in almost all the modern electronic devices. However, nanoscale dimensions...
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | | Contributor(s):: Amir Moshar
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | | Contributor(s):: Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray...
17 Mar 2008 | | Contributor(s):: Sansiri Tanachutiwat, Wei Wang, Nicholas Anthony Connelly
Estimate performances of graphene interconnects
PETE : Purdue Emerging Technology Evaluator
26 Jun 2007 | | Contributor(s):: Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy
Estimate circuit level performance and power of novel devices
Carbon Nanotubes Interconnect Analyzer (CNIA)
14 Mar 2007 | | Contributor(s):: Sansiri Tanachutiwat, Wei Wang
Analyze performances of carbon nanotube bundle interconnects
06 Feb 2007 | | Contributor(s):: wei zhao, yu cao
Predictive model files for future transistor technologies.