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[Illinois] AMC 2016 workshop: An introduction to elemental analysis by ED-XRF and an overview of its applications to materials characterization laboratories
13 Jun 2016 | Online Presentations | Contributor(s): Justin Masone
Advanced Material Characterization Workshop June 7-8 2016 Federick Seitz Materials Research Laboratory, University of Illinois at Urbana Champaign
[Illinois] Advanced Materials Characterization Workshop 2015
19 Aug 2015 | Workshops | Contributor(s): Ted Limpoco, Scott Speakman, Timothy P. Spila, Rick Haasch, Justin Masone, Kathy Walsh, Matthew Bresin
AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures...
[Illinois] Modeling and Characterization of Anisotropic Objects by Volume Integral Equation Methods
10 Mar 2015 | Online Presentations | Contributor(s): Lin Sun
Lin Sun received her B.S. and M.S. degrees in Electrical Engineering from Tsinghua University, Beijing, China, in 2001 and 2004 and Ph.D. degree in Electrical and Computer Engineering from the...
06 Mar 2015 | Data Exploration | Contributor(s): NanomaterialRegistry
View, visualize and download data using IDENT, the Interactive Data Exploration and Navigation Tool.
20 Jan 2015 | Online Presentations | Contributor(s): Lin Sun
[Illinois] Got Milk?: Characterization, Synthesis and Utilization of Human Milk Oligosaccharides
04 Feb 2014 | Online Presentations | Contributor(s): Michael Miller
April 18, 2013. BioEngineering Seminar Series. University of Illinois Urbana-Champaign
"Got Milk?: Characterization, Synthesis and Utilization of Human Milk Oligosaccharides"
Dr. Michael Miller,...
Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles
20 Apr 2012 | Online Presentations | Contributor(s): Trisha Eustaquio
This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered...
Malvern Instruments Workshop: Nano-particle Characterization Symposium
11 Apr 2012 | Workshops | Contributor(s): James Leary
The key focus of the symposium is to demonstrate how different analytical techniques provide the information needed to advance nanotechnology.
Theory and characterization of random defect formation and its implication in variability of nanoscale transistors
30 Sep 2011 | Papers | Contributor(s): Ahmad Ehteshamul Islam
Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | Online Presentations | Contributor(s): Amir Moshar
Purdue University Discovery Park,
X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the...
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13 Jun 2008 | Tools | Contributor(s): Sansiri Tanachutiwat, Wei Wang, Nicholas Anthony Connelly
Estimate performances of graphene interconnects
PETE : Purdue Emerging Technology Evaluator
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27 Jun 2007 | Tools | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy
Estimate circuit level performance and power of novel devices
Carbon Nanotubes Interconnect Analyzer (CNIA)
14 Mar 2007 | Tools | Contributor(s): Sansiri Tanachutiwat, Wei Wang
Analyze performances of carbon nanotube bundle interconnects
09 Feb 2007 | Tools | Contributor(s): Wei Zhao, Yu Cao
Predictive model files for future transistor technologies.