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Tags: characterization

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  1. Application of Dynamic Light Scattering in the Physicochemical Characterization of Natural and Engineered Nanoparticles

    20 Apr 2012 | Online Presentations | Contributor(s): Trisha Eustaquio

    This presentation will highlight the use of dynamic light scattering (DLS), which measures the hydrodynamic size of nanoparticles in suspension, in characterizing specific examples of engineered...

  2. Baskaran Karthikeyan

    A Curious Student involved in science

  3. Carbon Nanotubes Interconnect Analyzer (CNIA)

    14 Mar 2007 | Tools | Contributor(s): Sansiri Tanachutiwat, Wei Wang

    Analyze performances of carbon nanotube bundle interconnects

  4. Electronic Characterization of Materials Using Conductive AFM

    03 May 2011 | Online Presentations | Contributor(s): Amir Moshar

    Purdue University Discovery Park, Asylum Research

  5. Graphene Interconnect

    17 Mar 2008 | Tools | Contributor(s): Sansiri Tanachutiwat, Wei Wang, Nicholas Anthony Connelly

    Estimate performances of graphene interconnects

  6. Greg Lush

    EducationBS, Electrical Engineering, May 1985, University of Notre DameMS, Electrical Engineering, December 1987, Purdue UniversityPh.D., Electrical Engineering 1992, Purdue University

  7. Hitesh Kamble

    It is difficult to tell you about me. But I could tell you about "'''espacio'''". It means "space" in Spanish language so there are no boundaries. There is no boundary, rule, principle to my life....

  8. Jul 08 2013

    Interdisciplinary Symposium on Advanced Nano/Biosystems: Design, Fabrication, and Characterization

    Nano/bio systems have emerged as highly interdisciplinary research areas in the last few decades, spanning physics, chemistry, biology, mechanics, and material science. Synergizing material...

  9. Introduction to Reliability

    Generalized Reliability Model A Blind Fish in a River with a Waterfall Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...

  10. John Jay Young

    Please see resume. Thanks

  11. Kevin Grossklaus

    I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion...

  12. Malvern Instruments Workshop: Nano-particle Characterization Symposium

    11 Apr 2012 | Workshops | Contributor(s): James Leary

    The key focus of the symposium is to demonstrate how different analytical techniques provide the information needed to advance nanotechnology.

  13. Monica Marie Cortez Allain

  14. Nano-CMOS

    06 Feb 2007 | Tools | Contributor(s): Wei Zhao, Yu Cao

    Predictive model files for future transistor technologies.

  15. Nanomaterial Registry

    06 Mar 2015 | Data Exploration | Contributor(s): NanomaterialRegistry

    View, visualize and download data using IDENT, the Interactive Data Exploration and Navigation Tool.

  16. Nov 17 2009

    Nanomaterials and Human Health & Instrumentation, Metrology, and Analytical Methods

    This is the third workshop in the National Nanotechnology Initiative's nanoEHS workshop series. This highly integrated workshop brings together the areas of nanomaterials and human health research...

  17. PETE : Purdue Emerging Technology Evaluator

    26 Jun 2007 | Tools | Contributor(s): Arijit Raychowdhury, Charles Augustine, Yunfei Gao, Mark Lundstrom, Kaushik Roy

    Estimate circuit level performance and power of novel devices

  18. Standard Practice for Workforce Education in Nanotechnology Characterization

    Collections | 12 May 2015 | Posted by Tanya Faltens

  19. Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

    30 Sep 2011 | Papers | Contributor(s): Ahmad Ehteshamul Islam

    Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...

  20. X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

    29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

    A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the..., a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.