Due to local system maintenance on Tuesday, September 27th, nanoHUB will be unable to launch simulation jobs on clusters conte, rice, carter, and hansen. We apologize for any inconvenience.
Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
0.0 out of 5 stars
03 Oct 2013 | Tools | Contributor(s): Oluwatosin Adeosun, Sambit Palit, Ankit Jain, Muhammad Alam, Xin Jin
Simulation suite for electromechanical actuators
ECE 695A Lecture 17R: Review Questions
01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation?
Why do people like to use C-V techniques? What method would you use for HCI...
ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics
26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck
Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Introduction to Device Characterization -
System Overview: System Architecture, Hardware Features and Software Features -
Precision DC I-V Source-Measure Features and Concepts.
Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
Keithley 4200-SCS Lecture 03: More KITE Setup and Features
Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
Keithley 4200-SCS Lecture 06: Troubleshooting
Keithley 4200-SCS Lecture 07: KCON Utility Overview
Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
Theory of Operation and Measurement Overview
Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
Measurement Techniques and Optimization
Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
Keithley 4200-SCS: KITE Demo
Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
Device Characterization with the Keithley 4200-SCS
20 Jan 2011 | Courses | Contributor(s): Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...
CV profile with different oxide thickness
20 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck
C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to...
Illinois ECE 440: MOS Capacitor Homework
28 Jan 2010 | Teaching Materials | Contributor(s): Mohamed Mohamed
This homework covers Threshold Voltage, MOS Band Diagram, and MOS Capacitance-Voltage Analysis.
schred running ok?
Closed | Responses: 0
The CV for very thin oxide (considering only G vs considering GLX) on GaAs seems to be exactly similar. Which...