Tags: Device Characterization

Online Presentations (1-17 of 17)

  1. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner...

  2. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...

  3. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

  4. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to...

  5. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | | Contributor(s):: Lee Stauffer

  6. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.

  7. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  8. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  9. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  10. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  11. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  12. Keithley 4200-SCS: KITE Demo

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  13. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  14. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Theory of Operation and Measurement Overview

  15. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  16. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  17. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | | Contributor(s):: Lee Stauffer