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Tags: Device Characterization

Resources (1-19 of 19)

  1. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it...

    https://nanohub.org/resources/13611

  2. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13612

  3. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13613

  4. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    https://nanohub.org/resources/13614

  5. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...

    https://nanohub.org/resources/11249

  6. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10521

  7. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

    https://nanohub.org/resources/10387

  8. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10388

  9. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10389

  10. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10390

  11. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10391

  12. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10392

  13. Keithley 4200-SCS: KITE Demo

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10429

  14. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10430

  15. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Theory of Operation and Measurement Overview

    https://nanohub.org/resources/10431

  16. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    https://nanohub.org/resources/10432

  17. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    https://nanohub.org/resources/10433

  18. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10480

  19. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...

    https://nanohub.org/resources/10386

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.