Tags: Device Characterization

Resources (1-19 of 19)

  1. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it...

    https://nanohub.org/resources/13611

  2. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13612

  3. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13613

  4. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    https://nanohub.org/resources/13614

  5. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...

    https://nanohub.org/resources/11249

  6. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10521

  7. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

    https://nanohub.org/resources/10387

  8. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10388

  9. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10389

  10. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10390

  11. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10391

  12. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10392

  13. Keithley 4200-SCS: KITE Demo

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10429

  14. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10430

  15. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Theory of Operation and Measurement Overview

    https://nanohub.org/resources/10431

  16. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    https://nanohub.org/resources/10432

  17. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    https://nanohub.org/resources/10433

  18. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10480

  19. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...

    https://nanohub.org/resources/10386