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Ahmad Ehteshamul Islam
Ahmed Ibrahim Saeed
Device Characterization with the Keithley 4200-SCS
20 Jan 2011 | Courses | Contributor(s): Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...
Dhawal Dilip Mahajan
Kei May Lau
Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Introduction to Device Characterization -
System Overview: System Architecture, Hardware Features and Software Features -
Precision DC I-V Source-Measure Features and Concepts.
Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
Keithley 4200-SCS Lecture 03: More KITE Setup and Features
Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
Keithley 4200-SCS Lecture 06: Troubleshooting
Keithley 4200-SCS Lecture 07: KCON Utility Overview
Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
Theory of Operation and Measurement Overview
Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
Measurement Techniques and Optimization
Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
24 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer
Keithley 4200-SCS: KITE Demo
Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling
28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...
Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)
11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...