Tags: Device Characterization

All Categories (1-20 of 28)

  1. Ahmad Ehteshamul Islam

    Ahmad Ehteshamul Islam is currently a Research Scientist at UES, Inc. and is working in the Soft Matter Branch in Materials and Manufacturing Directorate (RXAS), Air Force Research Laboratory...

    https://nanohub.org/members/9615

  2. Ahmed Ibrahim Saeed

    https://nanohub.org/members/35970

  3. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

  4. Dhawal Dilip Mahajan

    https://nanohub.org/members/65429

  5. Kei May Lau

    Chair Professor of Electrical and Electronic Engineering at Hong Kong University of Science and TechnologyProfessor Kei May Lau received the B.S. and M.S. degrees in physics from the University of...

    https://nanohub.org/members/53046

  6. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.

  7. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  8. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  9. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  10. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  11. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  12. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  13. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Theory of Operation and Measurement Overview

  14. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  15. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  16. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  17. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | | Contributor(s):: Lee Stauffer

  18. Keithley 4200-SCS: KITE Demo

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  19. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...

  20. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to...