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Ahmad Ehteshamul Islam
I am a Research Team Lead at the Electronic Devices Branch (RYDD) of Air Force Research Laboratory (AFRL), Sensors Directorate. We are located at the Wright-Patterson Air Force Base in Dayton,...
https://nanohub.org/members/9615
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Ahmed Ibrahim Saeed
https://nanohub.org/members/35970
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Device Characterization with the Keithley 4200-SCS
20 Jan 2011 | | Contributor(s):: Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
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Dhawal Dilip Mahajan
https://nanohub.org/members/65429
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Kei May Lau
Chair Professor of Electrical and Electronic Engineering at Hong Kong University of Science and TechnologyProfessor Kei May Lau received the B.S. and M.S. degrees in physics from the University of...
https://nanohub.org/members/53046
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Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.
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Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 03: More KITE Setup and Features
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 04: Speed and Timing Considerations
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 06: Troubleshooting
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 07: KCON Utility Overview
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Theory of Operation and Measurement Overview
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Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
24 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS: KITE Demo
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling
28 Mar 2012 | | Contributor(s):: Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)
11 May 2011 | | Contributor(s):: Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to...