NEMO5 Tutorials (2012 Summer School)
19 Jul 2012 | | Contributor(s):: James Fonseca, Tillmann Christoph Kubis, Michael Povolotskyi, Jean Michel D Sellier, Parijat Sengupta, Junzhe Geng, Mehdi Salmani Jelodar, Seung Hyun Park, Gerhard Klimeck
While the general topics presented in the summer school materials are still applicable, many details have changed. If you are looking at these to learn how to use NEMO5, check out the newer materials here: https://nanohub.org/resources/21824
Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling
28 Mar 2012 | | Contributor(s):: Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...
Illinois ECE 440: Solid State Electronic Devices
out of 5 stars
18 Aug 2008 | | Contributor(s):: Eric Pop
The goals of this course are to give the student an understanding of the elements of semiconductor physics and principles of semiconductor devices that (a) constitute the foundation required for an electrical engineering major to take follow-on courses, and (b) represent the essential basic...