Tags: device physics

Online Presentations (21-40 of 85)

  1. ECE 606 Lecture 8: Temperature Dependent Carrier Density Concepts of Recombination

    28 Sep 2012 | | Contributor(s):: Gerhard Klimeck

  2. ECE 606 Lecture 9: Recombination Process and Rates

    28 Sep 2012 | | Contributor(s):: Gerhard Klimeck

  3. ECE 606 Lecture 4: Periodic Potentials Solutions of Schrödinger's Equation

    14 Sep 2012 | | Contributor(s):: Gerhard Klimeck

  4. ECE 606 Lecture 2: Quantum Mechanics

    14 Sep 2012 | | Contributor(s):: Gerhard Klimeck

  5. ECE 606 Lecture 3: Emergence of Bandstructure

    31 Aug 2012 | | Contributor(s):: Gerhard Klimeck

    Table of Contents:00:00ECE606: Solid State Devices Lecture 300:24Motivation01:17Time-independent Schrodinger Equation02:22Time-independent Schrodinger Equation04:23A Simple Differential Equation05:29Presentation Outline05:46Full Problem Difficult: Toy Problems First06:07Case 1: Solution for...

  6. ECE 606 Lecture 1: Introduction/Crystal Classification

    30 Aug 2012 | | Contributor(s):: Gerhard Klimeck

  7. Solar Cells Lecture 4: What is Different about Thin-Film Solar Cells?

    29 Aug 2011 | | Contributor(s):: Muhammad A. Alam

    Thin film solar cells promise acceptable efficiency at low cost. This tutorial examines the device physics of thin-film solar cells, which generally require a different type of analysis than crystalline solar cells.

  8. Solar Cells Lecture 5: Organic Photovoltaics

    29 Aug 2011 | | Contributor(s):: Muhammad A. Alam

    Organic solar cells make use of low-cost organic polymers forphotovoltaics. Although these solar cells may appear to be quitedifferent from solar cells made with conventional, inorganicsemiconductors (e.g. they make use of exciton generation rather than electron-hole generation) this...

  9. Lecture 7: On Reliability and Randomness in Electronic Devices

    14 Apr 2010 | | Contributor(s):: Muhammad A. Alam

    Outline:Background informationPrinciples of reliability physicsClassification of Electronic ReliabilityStructure Defects in Electronic MaterialsConclusions

  10. Lecture 9: Breakdown in Thick Dielectrics

    05 Apr 2010 | | Contributor(s):: Muhammad A. Alam

    Outline:Breakdown in gas dielectric and Paschen’s lawSpatial and temporal dynamics during breakdownBreakdown in bulk oxides: puzzleTheory of pre-existing defects: Thin oxidesTheory of pre-existing defects: thick oxidesConclusions

  11. Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

    10 Mar 2010 | | Contributor(s):: Muhammad A. Alam

  12. Illinois ECE 440 Solid State Electronic Devices, Lecture 22&23: P-N Junction Capacitance; Contacts

    07 Mar 2010 | | Contributor(s):: Eric Pop

  13. Illinois ECE 440 Solid State Electronic Devices, Lecture 24: Narrow-base P-N Diode

    07 Mar 2010 | | Contributor(s):: Eric Pop

  14. Illinois ECE 440 Solid State Electronic Devices, Lecture 25: Intro to BJT

    07 Mar 2010 | | Contributor(s):: Eric Pop

  15. Illinois ECE 440 Solid State Electronic Devices, Lecture 26: Narrow-base BJT

    07 Mar 2010 | | Contributor(s):: Eric Pop

  16. Illinois ECE 440 Solid State Electronic Devices, Lecture 27: BJT Gain

    07 Mar 2010 | | Contributor(s):: Eric Pop

  17. Illinois ECE 440 Solid State Electronic Devices, Lecture 21: P-N Diode Breakdown

    07 Mar 2010 | | Contributor(s):: Eric Pop

  18. Lecture 10: Interface Damage & Negative Bias Temperature Instability

    02 Feb 2010 | | Contributor(s):: Muhammad A. Alam

    Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions

  19. Illinois ECE 440 Solid State Electronic Devices, Lecture 20: P-N Diode in Reverse Bias

    18 Nov 2009 | | Contributor(s):: Eric Pop

    Recap diode (forward, zero, reverse) bias diagrams.Recap some of the equations.

  20. ECE 606 Lecture 40: Looking Back and Looking Forward

    30 Apr 2009 |