Tags: electron microscopy

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Online Presentations (1-20 of 33)

  1. [Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes

    04 Jun 2013 | | Contributor(s):: Andrei Kolmakov

    Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of these new materials and devices depends on physicochemical processes taking place at the interface...

  2. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  3. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    18 Feb 2010 | | Contributor(s):: Klaus Schulten

  4. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

  5. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    29 May 2008 | | Contributor(s):: Eric Stach

  6. MSE 640 Lecture 13: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

  7. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  8. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  9. MSE 640 Lecture 11: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Thickness fringes, Bend contours, Planar faults

  10. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

    28 May 2008 | | Contributor(s):: Eric Stach

  11. MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

    28 May 2008 | | Contributor(s):: Eric Stach

  12. MSE 640 Lecture 18: X-ray production in the TEM

    28 May 2008 | | Contributor(s):: Eric Stach

  13. MSE 640 Lecture 17: STEM Imaging

    27 May 2008 | | Contributor(s):: Eric Stach

  14. MSE 640 Lecture 5,6,7: Review

    17 Apr 2008 | | Contributor(s):: Eric Stach

  15. MSE 640 Lecture 7: Dynamical effects in diffraction patterns

    17 Apr 2008 | | Contributor(s):: Eric Stach

  16. Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)

    11 Apr 2008 | | Contributor(s):: Paul R Selvin

    Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at headsNanometer spatial localization, Second temporal resolution, Single Molecule sensitivitySingle Molecule Photostability

  17. MSE 640 Lecture 4: Laue Diffraction and the Reciprocal Lattice

    05 Mar 2008 | | Contributor(s):: Eric Stach

  18. MSE 640 Lecture 2: Elastic Scattering, Part 2

    03 Mar 2008 | | Contributor(s):: Eric Stach

  19. MSE 640 Lecture 2: Elastic Scattering, Part 1

    25 Feb 2008 | | Contributor(s):: Eric Stach

  20. MSE 582 Lecture 12: Analytical Electron Microscopy

    15 Feb 2008 | | Contributor(s):: Eric Stach