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An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.
Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.
[Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes
04 Jun 2013 | | Contributor(s):: Andrei Kolmakov
Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of these new materials and devices depends on physicochemical processes taking place at the interface...
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
out of 5 stars
29 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 11: Diffraction contrast imaging
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
28 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
MSE 640 Lecture 18: X-ray production in the TEM
MSE 640 Lecture 17: STEM Imaging
27 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 5,6,7: Review
17 Apr 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 7: Dynamical effects in diffraction patterns
Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)
11 Apr 2008 | | Contributor(s):: Paul R Selvin
Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at headsNanometer spatial localization, Second temporal resolution, Single Molecule sensitivitySingle Molecule Photostability
MSE 640 Lecture 4: Laue Diffraction and the Reciprocal Lattice
05 Mar 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 2: Elastic Scattering, Part 2
03 Mar 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 2: Elastic Scattering, Part 1
25 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | | Contributor(s):: Eric Stach