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MSE 640 Lecture 2: Elastic Scattering, Part 1
25 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
14 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 9: Diffraction
11 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 8: Electron Scattering
11 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 7: Sample Preperation
11 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 5: Electron Detection
04 Feb 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 6: Vacuum Science in EM
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 1: Introduction
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 4: The Instrument, Part 1
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
28 Jan 2008 | | Contributor(s):: Eric Stach
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MSE 582 Transmission Electron Microscopy Skills
28 Jan 2008 | | Contributor(s):: Eric Stach
Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.
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BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
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Understanding Deformation Processes in Nanocrystalline Metals Through the Use of Real-time Electron Microscopy Techniques
03 May 2007 | | Contributor(s):: Eric Stach
It is has long been known that the grain size of a material has a substantial effect on its mechanical strength, through the well-established Hall-Petch relationship. In the past decade or so, there has been a resurgence of interest in this topic resulting from the ability to create metals with...
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What Can the TEM Tell You About Your Nanomaterial?
26 Feb 2007 | | Contributor(s):: Eric Stach
In this tutorial, I will present a brief overview of the ways that transmission electron microscopy can be used to characterize nanoscale materials. This tutorial will emphasize what TEM does well, as well where difficulties arise. In particular, I will discuss in an overview manner how...
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X-Ray Photoelectron Spectroscopy (XPS)
14 Dec 2006 | | Contributor(s):: David Echevarria Torres
The XPS (X-Ray Photoelectron Spectroscopy) it is also known as ESCA (Electron Spectroscopy for Chemical Analysis). This technique is based on the theory of the photoelectric effect that was developed by Einstein, yet it was Dr. Siegbahn and his research group who developed the XPS technique. ...