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[Illinois] AVS Meeting 2012: Photoelectron and Electron Spectro-Microscopy in Liquids and Dense Gaseous Environment Using Electron Transparent Membranes
04 Jun 2013 | Online Presentations | Contributor(s): Andrei Kolmakov
Novel bottom-up designed materials currently constitute the major source of innovations in electronics, optics, energy harvesting/storage, catalysis and bio-medical applications. The performance of …
https://nanohub.org/resources/18254
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On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic …
https://nanohub.org/resources/15606
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Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant …
https://nanohub.org/resources/15322
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Nanostructure of Perpendicular Recording Media
26 Sep 2012 | Publications | Contributor(s): Brian Demczyk
This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.
https://nanohub.org/resources/15304
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Matt Schneider
https://nanohub.org/members/66808
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Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | Publications | Contributor(s): Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations …
https://nanohub.org/resources/13031
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Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
30 Jan 2012 | Publications | Contributor(s): Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
https://nanohub.org/resources/12967
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Kevin Grossklaus
I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion beam …
https://nanohub.org/members/60848
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Timothy Gutu
https://nanohub.org/members/58494
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Brian Demczyk
My research experience has included the areas of energy storage (batteries and fuel cells), nanophase materials (catalysts, nanotubes and quantum dots), the development of stresses in thin films and …
https://nanohub.org/members/56446
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David Charles Martin
1983 B. S. in Materials and Metallurgical Engineering, The University of Michigan 1985 M. S. in Macromolecular Science and Engineering, The University of Michigan 1990 Ph.D. in Polymer Science and …
https://nanohub.org/members/45318
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ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach
Guest lecture: Eric A. Stach
https://nanohub.org/resources/8587
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Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten
…
https://nanohub.org/resources/8511
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ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …
https://nanohub.org/resources/6583
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MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
https://nanohub.org/resources/4641
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MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
https://nanohub.org/resources/4640
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MSE 640 Lecture 13: Diffraction contrast imaging
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
Weak beam dark field imaging, Simulation of diffraction contrast
https://nanohub.org/resources/4639
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MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
https://nanohub.org/resources/4637
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MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
https://nanohub.org/resources/4638
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MSE 640 Lecture 11: Diffraction contrast imaging
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
Thickness fringes, Bend contours, Planar faults
https://nanohub.org/resources/4636