Tags: experiments

Courses (1-4 of 4)

  1. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

  2. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    Fall 2010A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

  3. Colloquium on Graphene Physics and Devices

    22 Sep 2009 | | Contributor(s):: Joerg Appenzeller, Supriyo Datta, Mark Lundstrom

    This short course introduces students to graphene as a fascinating research topic as well as to develop their skill in problem solving using the tools and techniques of electronics from the bottom up.

  4. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

    03 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.