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Some Important Aspects of the Chemistry of Nanomaterials
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01 Jul 2008 | | Contributor(s):: C.N.R. Rao
Keynote address for the launch of the Center for Analytical Instrumentation Development.
Multiphase Gallium Nitride Nanowires and Nanocircuits
04 Feb 2008 | | Contributor(s):: Virginia M. Ayres
Catalyst-free vapor-solid nanowire growth, a newly described method for the production of nanowires compatible with a wide variety of semiconductor materials, has been used to produce novel multiphase zinc-blende/wurtzite gallium nitride nanowires. Orientation relation-ships within the...
X-ray Photoelectron Spectroscopy (XPS) Tour
24 Jan 2008 | | Contributor(s):: Dmitry Zemlyanov
A guided tour, given by Dmitry Zemlyanov, of the X-ray Photoelectron Spectroscopy (XPS) lab located in the Birck Nanotechnology Center at Purdue University.
Nanometrology Room Design: The Performance and Characterization of the Kevin G. Hall Nanometrology Laboratory
22 Jan 2008 | | Contributor(s):: Ron Reifenberger
This seminar summarizes the capabilities of the high accuracy Kevin G. Hall Laboratory which is located in Purdue’s newly completed Birck Nanotechnology Center. The seminar is primarily intended for anyone interested in designing, building and characterizing a high accuracy room for nanoscience...
Kevin G. Hall Nanometrology Room Tour: Facility Design, Performance and Characterization
09 Jan 2008 | | Contributor(s):: Ron Reifenberger
A walk through tour given by Ron Reifenberger of the Kevin G. Hall Nanometrology room located in the Birck Nanotechnology Center at Purdue University.
SPMW Scanning Probe Acceleration Microscopy: Towards Real Time Reconstruction of Tip-Sample Forces in Tapping Mode AFM
05 Jan 2007 | | Contributor(s):: Tomasz Kowalewski
Tapping mode atomic force microscopy (TMAFM) in fluids has become an increasingly important technique, especially in studying biological samples under near physiological conditions. However, until recently the physics of tapping mode operation under fluids has not been well understood. The first...
Combining New Experimental and Informatic Tools for Protein Investigation and Engineering
09 Jan 2008 | | Contributor(s):: Alan Friedman
The stability and activity of proteins is dependent on both the correct functioning and placement of individual amino acids and their interactions. Great attention has been paid to critical individual residues (generally revealed by their location in the active site and their conservation among...
SPMW Single molecule recognition atomic force microscopy
05 Jan 2007 | | Contributor(s)::
In molecular recognition force microscopy (MRFM), ligands are covalently attached to atomic force microscopy tips for the molecular recognition of their cognitive receptors on probe surfaces. A ligand-containing tip is approached towards the receptors on the probe surface, which possibly leads...
SPMW Scanning Impedance Microscopy: probing local electronic structure and transport anomalies
05 Jan 2007 | | Contributor(s):: dawn bonnell
Multiple modulation SPM is a general term for a strategy that extracts information about a surface or nanostructure by combining various signals on samples and tips, using multiple frequencies to distinguish them and accessing multiple harmonics in detection. In addition to the usual...
An Experimentalists’ Perspective
19 Dec 2007 | | Contributor(s):: Arunava Majumdar
This presentation was one of 13 presentations in the one-day forum, "Excellence in Computer Simulation," which brought together a broad set of experts to reflect on the future of computational science and engineering.
Amine Linked Single Molecule Circuits: Systematic Measurements & Understanding
02 Jul 2007 | | Contributor(s):: Mark S Hybertsen
Formation and function of well-defined linkages between organic molecules and metallic electrodes has been a key issue in the field of molecular electronics. We recently discovered that the conductance of single molecule junctions formed using gold-amine linkages can be measured reliably and...
SPMW The Nanomechanics of compositional mapping in amplitude modulation AFM
05 Jan 2007 | | Contributor(s):: Ricardo Garcia
Amplitude modulation atomic force microscopy (AM-AFM) has been very successful for imaging with high spatial resolution inorganic as well as soft materials such as polymers, living cells and single biomolecules in their natural environment . The ability of AM-AFM to separate topography from...
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
SPMW FIRAT: A fast and sensitive probe structure for SPM
A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines a micromachined integrated electrostatic actuator to move the tip and an integrated optical...
BNC Annual Research Symposium: Welcome and Overview
23 Apr 2007 | | Contributor(s)::
BNC Annual Research Symposium: Nanoscale Energy Conversion
23 Apr 2007 | | Contributor(s):: Timothy S Fisher
Planning for Disaster: Designing a Cleanroom to Minimize Risk Should a Disaster Occur
09 Apr 2007 | | Contributor(s):: John Weaver
The cleanliness levels of a cleanroom or other high-technology facility make it inherently vulnerable to a disaster such as a fire. Historically, even a small event of this type can cause significant downtime and cost millions of dollars in remediation. When designing a cleanroom, steps can be...
Toward Improving the Precision of Nanoscale Force-Displacement Measurements
13 Mar 2007 | | Contributor(s):: Jason Clark
Nanotechnology has great potential for being used to create better medicines, materials, and sensors. With increasing interest in nanotechnology to improve the quality of our lives, there has been an increasing use of nanoscience tools to measure force and displacement to understand nanoscale...
What Can the TEM Tell You About Your Nanomaterial?
26 Feb 2007 | | Contributor(s):: Eric Stach
In this tutorial, I will present a brief overview of the ways that transmission electron microscopy can be used to characterize nanoscale materials. This tutorial will emphasize what TEM does well, as well where difficulties arise. In particular, I will discuss in an overview manner how...
SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers
30 Nov 2006 | | Contributor(s):: ,
High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet...