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SPMW FIRAT: A fast and sensitive probe structure for SPM
0.0 out of 5 stars
08 May 2007 | Online Presentations | Contributor(s): F. Levent Degertekin
A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines...
Introduction to Scanning Tunneling Microscopy
24 Apr 2007 | Animations | Contributor(s): Hyung-Seok Hahm
This is a 60 second movie clip with an introduction to Scanning Tunneling Microscopy(STM).
Design goals are
- Give an idea of what STM looks like
- Provide an overview of what STM does and...
Operation of Scannig Tunneling Microscopy
This is a 60-second movie clip with a narration of how Scanning Tunneling Microscopy(STM) operates. Produced by Eric Meyer, Imran Sobh and Hyung-Seok Hahm Beckman Institute
University of Illinois...
BNC Annual Research Symposium: Welcome and Overview
23 Apr 2007 | Online Presentations | Contributor(s): Timothy D. Sands
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the...
BNC Annual Research Symposium: Nanoscale Energy Conversion
23 Apr 2007 | Online Presentations | Contributor(s): Timothy S Fisher
Planning for Disaster: Designing a Cleanroom to Minimize Risk Should a Disaster Occur
09 Apr 2007 | Online Presentations | Contributor(s): John Weaver
The cleanliness levels of a cleanroom or other high-technology
facility make it inherently vulnerable to a disaster such as a fire.
Historically, even a small event of this type can cause...
Toward Improving the Precision of Nanoscale Force-Displacement Measurements
5.0 out of 5 stars
13 Mar 2007 | Online Presentations | Contributor(s): Jason Clark
Nanotechnology has great potential for being used to create
better medicines, materials, and sensors. With increasing
interest in nanotechnology to improve the quality of our
What Can the TEM Tell You About Your Nanomaterial?
26 Feb 2007 | Online Presentations | Contributor(s): Eric Stach
In this tutorial, I will present a brief overview of the ways that transmission electron microscopy can be used to characterize nanoscale materials. This tutorial will emphasize what TEM does...
Frontiers in Scanning Probe Microscopy
12 Feb 2007 | Workshops
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the...
SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers
12 Feb 2007 | Online Presentations | Contributor(s): Sergei Magonov, Sergey Belikov
High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional...
SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex
08 Feb 2007 | Online Presentations | Contributor(s): J. P. AimÃ©
Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous...
SPMW Nanomechanics: from nanotechnology to biology
08 Feb 2007 | Online Presentations | Contributor(s): Elisa Riedo
The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and...
SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
08 Feb 2007 | Online Presentations | Contributor(s): Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to...
SPMW Mechanisms of atomic friction studied by friction force microscopy
13 Jan 2007 | Online Presentations | Contributor(s): Ernst Meyer
Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will...
X-Ray Photoelectron Spectroscopy (XPS)
14 Dec 2006 | Teaching Materials | Contributor(s): David Echevarria Torres
The XPS (X-Ray Photoelectron Spectroscopy) it is also known as ESCA (Electron Spectroscopy for Chemical Analysis). This technique is based on the theory of the photoelectric effect that was...
4.0 out of 5 stars
13 Dec 2006 | Teaching Materials | Contributor(s): Lynn Marie Santiago
This is the fourth contribution from the students in the University of Texas at El Paso Molecular Electronics course given in the fall of 2006.
This presentation is presented at the...
Materials Science on the Atomic Scale with the 3-D Atom Probe
16 Nov 2006 | Online Presentations | Contributor(s): George D. W. Smith
Some of the key goals of materials science and technology are to be able to design a material from first principles, to predict its behaviour, and also to optimise the processing route for its...
A Primer on Scanning Tunneling Microscopy (STM)
04 Apr 2006 | Online Presentations | Contributor(s): Ron Reifenberger
Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the...
Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology
17 Mar 2006 | Online Presentations | Contributor(s): Eric Stach
This tutorial presents a broad overview of the basic physical principles of techniques used in scanning electron microscopy (SEM), as well as their application to understanding...
Metal Oxide Nanowires: Synthesis, Characterization and Device Applications
17 Mar 2006 | Online Presentations | Contributor(s): Jia Grace Lu
Various metal oxide nanowires, such as ZnO, SnO2, Fe2O3, In2O3 and Ga2O3, have been synthesized by chemical vapor deposition method. Their structures and properties are
characterized by TEM,...