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SPMW FIRAT: A fast and sensitive probe structure for SPM
05 Jan 2007 | | Contributor(s):: F. Levent Degertekin
A new SPM probe, called the force sensing integrated readout and active tip (FIRAT), is described and initial experimental results obtained on commercial AFM systems are presented. FIRAT combines a micromachined integrated electrostatic actuator to move the tip and an integrated optical...
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Introduction to Scanning Tunneling Microscopy
20 Apr 2007 | | Contributor(s):: Hyung-Seok Hahm
This is a 60 second movie clip with an introduction to Scanning Tunneling Microscopy(STM). Design goals are - Give an idea of what STM looks like- Provide an overview of what STM does and how it worksProduced by Imran Sobh and Hyung-Seok HahmAs part of instructional materials by...
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Operation of Scannig Tunneling Microscopy
20 Apr 2007 | | Contributor(s):: Hyung-Seok Hahm
This is a 60-second movie clip with a narration of how Scanning Tunneling Microscopy(STM) operates. Produced by Eric Meyer, Imran Sobh and Hyung-Seok Hahm Beckman InstituteUniversity of Illinois at Urbana-Champaign As part of instructional materials by National Center for Learning and Teaching in...
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BNC Annual Research Symposium: Welcome and Overview
23 Apr 2007 | | Contributor(s):: Timothy D. Sands
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
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BNC Annual Research Symposium: Nanoscale Energy Conversion
23 Apr 2007 | | Contributor(s):: Timothy S Fisher
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
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Planning for Disaster: Designing a Cleanroom to Minimize Risk Should a Disaster Occur
09 Apr 2007 | | Contributor(s):: John Weaver
The cleanliness levels of a cleanroom or other high-technology facility make it inherently vulnerable to a disaster such as a fire. Historically, even a small event of this type can cause significant downtime and cost millions of dollars in remediation. When designing a cleanroom, steps can be...
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Toward Improving the Precision of Nanoscale Force-Displacement Measurements
13 Mar 2007 | | Contributor(s):: Jason Clark
Nanotechnology has great potential for being used to create better medicines, materials, and sensors. With increasing interest in nanotechnology to improve the quality of our lives, there has been an increasing use of nanoscience tools to measure force and displacement to understand nanoscale...
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What Can the TEM Tell You About Your Nanomaterial?
26 Feb 2007 | | Contributor(s):: Eric Stach
In this tutorial, I will present a brief overview of the ways that transmission electron microscopy can be used to characterize nanoscale materials. This tutorial will emphasize what TEM does well, as well where difficulties arise. In particular, I will discuss in an overview manner how...
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Frontiers in Scanning Probe Microscopy
30 Nov 2006 |
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are...
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SPMW Interplay between theory and experiment in AFM nanomechanical studies of polymers
30 Nov 2006 | | Contributor(s):: Sergei Magonov, Sergey Belikov
High-resolution imaging of surfaces and compositional mapping of heterogeneous materials are the main functions of atomic force microscopy (AFM) in studies of polymer materials. Compositional mapping is mostly based on differences of mechanical properties of the sample components yet quantitative...
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SPMW Nanotube, nanoneedle and nanomeniscus: mechanical and wetting properties of modified AFM tip apex
12 Dec 2006 | | Contributor(s):: J. P. Aimé
Among AFM microscopes, Dynamic force microscopes (DFM) are very sensitive to variation of minute forces involved in the interaction between the tip and the surface. However, despite numerous efforts, imaging and probing mechanical properties of soft materials in air and water at the nm scale are...
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SPMW Nanomechanics: from nanotechnology to biology
12 Dec 2006 | | Contributor(s):: Elisa Riedo
The development of new materials with size of few nanometers has opened a new field of scientific and technological research. The goal is to develop faster and better communication systems and transports, as well as smarter and smaller nanodevices for biomedical applications. To reach these...
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SPMW Nonlinear dynamics in AFM - chaos and parametric resonance
05 Jan 2007 | | Contributor(s):: Arvind Raman
The field of nonlinear dynamics deals with mathematical techniques to study the nonlinear equations that serve as models of physical systems. The benefits of using nonlinear dynamics concepts to interpret and predict probe oscillations in dynamic AFM [1] are becoming increasingly clear. Nonlinear...
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SPMW Mechanisms of atomic friction studied by friction force microscopy
12 Dec 2006 | | Contributor(s):: Ernst Meyer
Force microscopy is a versatile instrument to investigate physical phenomena on surfaces. The first emphasis is on the study of friction on the nanometer-scale, also called nanotribology. It will be shown that atomic-scale stick-slip is relatively well understood, where the dependence on velocity...
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X-Ray Photoelectron Spectroscopy (XPS)
14 Dec 2006 | | Contributor(s):: David Echevarria Torres
The XPS (X-Ray Photoelectron Spectroscopy) it is also known as ESCA (Electron Spectroscopy for Chemical Analysis). This technique is based on the theory of the photoelectric effect that was developed by Einstein, yet it was Dr. Siegbahn and his research group who developed the XPS technique. ...
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Spectroscopic Ellipsometry
12 Dec 2006 | | Contributor(s):: Lynn Marie Santiago
This is the fourth contribution from the students in the University of Texas at El Paso Molecular Electronics course given in the fall of 2006.This presentation is presented at the undergraduate level and introduces spectroscopic ellipsometry, which is one of the most important characterization...
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Materials Science on the Atomic Scale with the 3-D Atom Probe
08 Nov 2006 | | Contributor(s):: George D. W. Smith
Some of the key goals of materials science and technology are to be able to design a material from first principles, to predict its behaviour, and also to optimise the processing route for its manufacture. In recent years, these goals have come closer to realisation, thanks in part to the...
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A Primer on Scanning Tunneling Microscopy (STM)
04 Apr 2006 | | Contributor(s):: Ron Reifenberger
Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the world-wide emergence of Nanotechnology. In this talk, the fundamental ideas behind the first scanning...
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Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology
27 Feb 2006 | | Contributor(s):: Eric Stach
This tutorial presents a broad overview of the basic physical principles of techniques used in scanning electron microscopy (SEM), as well as their application to understanding processing/structure/property relationships in nanostructured materials. Special emphasis is placed on the capabilities...
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Metal Oxide Nanowires: Synthesis, Characterization and Device Applications
07 Mar 2006 | | Contributor(s):: Jia Grace Lu
Various metal oxide nanowires, such as ZnO, SnO2, Fe2O3, In2O3 and Ga2O3, have been synthesized by chemical vapor deposition method. Their structures and properties are characterized by TEM, SEM, XRD, AFM, photoluminescence, photoconductance, scanning surface potential microscopy, and electrical...