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ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)
03 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman
A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
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ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)
01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman
Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
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ME 597A Lecture 7: Uncertainty Quantification in Experiments
16 Dec 2010 | | Contributor(s):: Arvind Raman
Guest Lecture Arvind Raman.
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Measurement of Single Molecule Conductance using STM-Based Break Junctions
28 Jul 2005 | | Contributor(s):: Nongjian Tao
We have measured single molecule conductance using a combined STM- and conducting AFM-based break junction method. The method works in aqueous solutions, which is suitable for biologically relevant molecules such as DNA and peptides, and also allows us to control electron transport through redox...
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Metal Oxide Nanowires: Synthesis, Characterization and Device Applications
07 Mar 2006 | | Contributor(s):: Jia Grace Lu
Various metal oxide nanowires, such as ZnO, SnO2, Fe2O3, In2O3 and Ga2O3, have been synthesized by chemical vapor deposition method. Their structures and properties are characterized by TEM, SEM, XRD, AFM, photoluminescence, photoconductance, scanning surface potential microscopy, and electrical...
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Modification of Si(111) Surfaces using Self - Assembled Monolayers (SAMs) for Electrochemical and AF
16 Aug 2004 | | Contributor(s):: Rosangelly Flores Pérez
Recent researchers in the electrical engineering field are using self-assembled monolayers techniques with aryldiazonium salts solutions to build nanoelectronic devices. This innovation can explain the molecular conductivity and the chemical covalent bonds between π- conjugated orbitals of the...
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Molecular Beam Epitaxy
16 Nov 2005 | | Contributor(s):: John C. Bean
Microelectronic devices are made by repeating two steps: 1) Depositing a thin uniform layer of material; 2) Then using a photographic process to pattern and remove unwanted areas of that layer.
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Multiphase Gallium Nitride Nanowires and Nanocircuits
04 Feb 2008 | | Contributor(s):: Virginia M. Ayres
Catalyst-free vapor-solid nanowire growth, a newly described method for the production of nanowires compatible with a wide variety of semiconductor materials, has been used to produce novel multiphase zinc-blende/wurtzite gallium nitride nanowires. Orientation relation-ships within the multiphase...
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Nanomanufacturing: Top-Down and Bottom-Up
14 Mar 2005 | | Contributor(s):: EPICS LSPM Team
Martin presents an overview of nanomanufacturing techniques, explaining the difference between top-down and bottom-up approaches.
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Nanometrology Room Design: The Performance and Characterization of the Kevin G. Hall Nanometrology Laboratory
22 Jan 2008 | | Contributor(s):: Ron Reifenberger
This seminar summarizes the capabilities of the high accuracy Kevin G. Hall Laboratory which is located in Purdue’s newly completed Birck Nanotechnology Center. The seminar is primarily intended for anyone interested in designing, building and characterizing a high accuracy room for nanoscience...
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Nanoscale Transistors Lecture 7: Comparison to Experimental Results
19 Jul 2012 | | Contributor(s):: Mark Lundstrom
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Operation of Scannig Tunneling Microscopy
20 Apr 2007 | | Contributor(s):: Hyung-Seok Hahm
This is a 60-second movie clip with a narration of how Scanning Tunneling Microscopy(STM) operates. Produced by Eric Meyer, Imran Sobh and Hyung-Seok Hahm Beckman InstituteUniversity of Illinois at Urbana-Champaign As part of instructional materials by National Center for Learning and Teaching in...
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Planning for Disaster: Designing a Cleanroom to Minimize Risk Should a Disaster Occur
09 Apr 2007 | | Contributor(s):: John Weaver
The cleanliness levels of a cleanroom or other high-technology facility make it inherently vulnerable to a disaster such as a fire. Historically, even a small event of this type can cause significant downtime and cost millions of dollars in remediation. When designing a cleanroom, steps can be...
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Probing Molecular Conduction with Scanning Probe Microscopy
08 Jul 2004 | | Contributor(s):: Mark Hersam
This tutorial will provide an overview of scanning probe microscopy (SPM) andits application towards problems in molecular conduction. In an effort to communicatethe power and limitations of these instruments, the tutorial will describe designconsiderations and reveal the detailed construction of...
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Probing Silicon-Based Molecular Electronics with Scanning Tunneling Microscopy
29 Jul 2005 | | Contributor(s):: Mark Hersam
In recent years, substantial progress has occurred in the field of molecular electronics [1]. In this paper, charge transport through molecule-semiconductor junctions is probed with ultra-high vacuum (UHV) scanning tunneling microscopy (STM). The presence of the semiconductor band gap enables new...
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Quantitative, Kinetic Models of Cellular Circuits
25 Feb 2009 | | Contributor(s):: Michael R. Brent
Living cells contain complex, analog circuits that regulate the rate at which each gene produces its product. The kinetic properties of these circuits enable cells to respond to changes in their environments and thus to survive, reproduce, and compete. For decades, molecular biologists have been...
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Quantum Coherent Effects in Photosynthesis
20 Jun 2011 | | Contributor(s):: K. Birgitta Whaley
I shall present and discuss theoretical studies of the quantum dynamics of a prototypical photosynthetic light harvesting complex, the Fenna-Matthews-Olson (FMO) complex, that analyze the nature and extent of two characteristic features of quantum processors, namely quantum speedup and quantum...
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Quantum Computing - Experiments
11 Aug 2011 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck
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Scanning Electron Microscope
16 Nov 2005 | | Contributor(s):: John C. Bean
This resource describes a scanning electron microscope (SEM). It includes detailed depictions of how the electron beam is focused and used to create hugely magnified images of experimental specimens.
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Scanning Probe Microscope Operation
16 Nov 2005 | | Contributor(s):: John C. Bean
Scanning Probe Microscopes (SPMs) include Atomic Force Microscopes (AFMs) and Scanning Tunneling Microscopes (STMs or STEMs). They are the only instruments in widespread use that can actually "see" single atoms! You can skim this resource quickly to learn the general concepts of SPMs, or you can...