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Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Theory of Operation and Measurement Overview
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Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II
20 Jan 2011 | | Contributor(s):: Lee Stauffer
Measurement Techniques and Optimization
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Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization
24 Jan 2011 | | Contributor(s):: Lee Stauffer
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Keithley 4200-SCS: KITE Demo
20 Jan 2011 | | Contributor(s):: Lee Stauffer
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Kevin G. Hall Nanometrology Room Tour: Facility Design, Performance and Characterization
09 Jan 2008 | | Contributor(s):: Ron Reifenberger
A walk through tour given by Ron Reifenberger of the Kevin G. Hall Nanometrology room located in the Birck Nanotechnology Center at Purdue University.
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Laser Cooling of Solids
06 Oct 2005 | | Contributor(s):: Massoud Kaviany
Enhanced laser cooling of ion doped nanocrystalline powders (e.g., Yb3+: Y2O3) can be achieved by enhancing the anti-Stokes, off-resonance absorption, which is proportional to the three design-controlled factors, namely, dopant concentration, pumping field energy, and anti-Stokes transition rate....
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Lecture 3: Low Bias Transport in Graphene: An Introduction
18 Sep 2009 | | Contributor(s):: Mark Lundstrom
Outline:Introduction and ObjectivesTheoryExperimental approachResultsDiscussionSummaryLecture notes are available for this lecture.
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Lecture 4: Graphene: An Experimentalist's Perspective
21 Sep 2009 | | Contributor(s):: Joerg Appenzeller
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Low Bias Transport in Graphene: An Introduction (lecture notes)
22 Sep 2009 | | Contributor(s):: Mark Lundstrom, tony low, Dionisis Berdebes
These notes complement a lecture with the same title presented by Mark Lundstrom and Dionisis Berdebes, at the NCN@Purdue Summer School, July 20-24, 2009.
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Making the Tiniest and Fastest Transistor using Atomic Layer Deposition (ALD)
13 Feb 2006 | | Contributor(s):: peide ye
Atomic layer deposition (ALD) is an emerging nanotechnology enables the deposit of ultrathin films, one atomic layer by one atomic layer. ALD provides a powerful, new capability to grow or regrow nanoscale ultrathin films of metals, semiconductors and insulators. This presentation introduces ALD...
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Many Body Effects on Optical Properties of Graphene
11 Jul 2016 | | Contributor(s):: Subhasis Ghosh
Graphene, a two-dimensional (2D) material shows remarkable optical and electronic properties, such as a linear energy dispersion, chirality and half-integer quantum Hall effect. Multilayer graphene flakes, held together by weak van der Waals forces have also attracted attention due to...
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Materials Science on the Atomic Scale with the 3-D Atom Probe
08 Nov 2006 | | Contributor(s):: George D. W. Smith
Some of the key goals of materials science and technology are to be able to design a material from first principles, to predict its behaviour, and also to optimise the processing route for its manufacture. In recent years, these goals have come closer to realisation, thanks in part to the...
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MCW07 Exploring Trends in Conductance for Well-Defined Single Molecule Circuits
04 Apr 2009 | | Contributor(s):: Mark S Hybertsen
In our recent research, we have been able to measure and characterize the impact of intrinsic molecular properties on the conductance of single molecule circuits formed with amine-gold linkages. In this talk, I will review the experiments and the physical picture of the junction based on the...
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ME 597 Lecture 12: Experimental Uncertainties in Extracting Material Properties from F-Z Curves
29 Oct 2010 | | Contributor(s):: Ryan Wagner, Arvind Raman
Guest lecturer: Ryan Wagner.
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ME 597 Lecture 17: Imaging or Peak Forces in Tapping Mode AFM
01 Nov 2009 | | Contributor(s):: Arvind Raman
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ME 597 Lecture 18: Stiffness Callibration and Amplitude Modulated Scanning
20 Oct 2010 | | Contributor(s):: Arvind Raman
The raw recording for this lecture is all that is available.
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ME 597 Lecture 20: Imaging Artifacts in AM-AFM
27 Jan 2010 | | Contributor(s):: Ron Reifenberger
Topics:Probe Tip ArtifactsInstrumental ArtifactsLarge Force ArtifactsImage Processing ArtifactsIntrinsic LimitationsTip Cleaning
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ME 597 Lecture 22: Frequency Modulated AFM - Experimental Details
02 Feb 2010 | | Contributor(s):: Ron Reifenberger