Tags: Hole Trapping

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  1. BTI Simulator for Two-Stage Model

    27 Jun 2017 | Downloads | Contributor(s): Rakesh P Rao, Narendra Parihar, Souvik Mahapatra

    This simulator calculates the kinetics associated with trapping and trap generation during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si p-MOSFETs. The calculations...

    https://nanohub.org/resources/26750

  2. On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory

    30 Dec 2009 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Souvik Mahapatra, Muhammad A. Alam

    Reaction-Diffusion (R-D) theory, well-known to successfully explain most features of NBTI stress, is perceived to fail in explaining NBTI recovery. Several efforts have been made to understand...

    https://nanohub.org/resources/8023