Tags: I-V curves

Resources (1-20 of 26)

  1. ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics

    26 Nov 2012 | | Contributor(s):: Gerhard Klimeck

  2. ECE 606 Lecture 23: MOSFET I-V Characteristics/MOSFET Non-Idealities

    26 Nov 2012 | | Contributor(s):: Gerhard Klimeck

  3. ECE 606 Lecture 24: MOSFET Non-Idealities

    26 Nov 2012 | | Contributor(s):: Gerhard Klimeck

  4. Nanoscale Transistors Lecture 2: IV Characteristics - traditional approach

    19 Jul 2012 | | Contributor(s):: Mark Lundstrom

  5. Solar Cells Lecture 1: Introduction to Photovoltaics

    19 Aug 2011 | | Contributor(s):: Mark Lundstrom

    An introduction to solar cells covering the basics of PN junctions, optical absorption, and IV characteristics. Key technology options and economic considers are briefly presented.

  6. FETToy

    14 Feb 2006 | | Contributor(s):: Anisur Rahman, Jing Wang, Jing Guo, Md. Sayed Hasan, Yang Liu, Akira Matsudaira, Shaikh S. Ahmed, Supriyo Datta, Mark Lundstrom

    Calculate the ballistic I-V characteristics for conventional MOSFETs, Nanowire MOSFETs and Carbon NanoTube MOSFETs

  7. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | | Contributor(s):: Lee Stauffer

  8. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

    Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.

  9. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  10. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  11. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  12. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  13. Keithley 4200-SCS Lecture 06: Troubleshooting

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  14. Keithley 4200-SCS: KITE Demo

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

  15. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

  16. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

    Theory of Operation and Measurement Overview

  17. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  18. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  19. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    19 Jan 2011 | | Contributor(s):: Lee Stauffer

  20. Device Characterization with the Keithley 4200-SCS

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.