Tags: I-V curves

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  1. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

  2. ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics

    26 Nov 2012 | | Contributor(s):: Gerhard Klimeck

  3. ECE 606 Lecture 23: MOSFET I-V Characteristics/MOSFET Non-Idealities

    26 Nov 2012 | | Contributor(s):: Gerhard Klimeck

  4. ECE 606 Lecture 24: MOSFET Non-Idealities

    26 Nov 2012 | | Contributor(s):: Gerhard Klimeck

  5. ECE 606 Lecture 35: MOSFET I-V Characteristics I

    16 Apr 2009 | | Contributor(s):: Muhammad A. Alam

  6. ECE 606 Lecture 36: MOSFET I-V Characteristics II

    28 Apr 2009 | | Contributor(s):: Muhammad A. Alam

  7. FETToy

    14 Feb 2006 | | Contributor(s):: Anisur Rahman, Jing Wang, Jing Guo, Md. Sayed Hasan, Yang Liu, Akira Matsudaira, Shaikh S. Ahmed, Supriyo Datta, Mark Lundstrom

    Calculate the ballistic I-V characteristics for conventional MOSFETs, Nanowire MOSFETs and Carbon NanoTube MOSFETs

  8. Illinois ECE 440: MOS Field-Effect Transistor Homework

    27 Jan 2010 | | Contributor(s):: Mohamed Mohamed

    This homework covers Output Characteristics and Mobility Model of MOSFETs.

  9. Illinois ECE 440: znipolar Junction Transistor (BJT) Homework

    27 Jan 2010 | | Contributor(s):: Mohamed Mohamed

    This homework covers BJT Fundamentals, Minority Carrier Distribution, and Terminal Currents.

  10. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

    Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.

  11. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  12. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  13. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  14. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  15. Keithley 4200-SCS Lecture 06: Troubleshooting

    12 Jan 2011 | | Contributor(s):: Lee Stauffer

  16. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

  17. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

    Theory of Operation and Measurement Overview

  18. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  19. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    18 Jan 2011 | | Contributor(s):: Lee Stauffer

    Measurement Techniques and Optimization

  20. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    19 Jan 2011 | | Contributor(s):: Lee Stauffer