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Tags: I-V curves

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  1. Device Characterization with the Keithley 4200-SCS

    20 Jan 2011 | Courses | Contributor(s): Lee Stauffer

    This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument,...

    https://nanohub.org/resources/10386

  2. ECE 606 Lecture 22: MOScap Frequence Response/MOSFET I-V Characteristics

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    https://nanohub.org/resources/15977

  3. ECE 606 Lecture 23: MOSFET I-V Characteristics/MOSFET Non-Idealities

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    https://nanohub.org/resources/15978

  4. ECE 606 Lecture 24: MOSFET Non-Idealities

    26 Nov 2012 | Online Presentations | Contributor(s): Gerhard Klimeck

    https://nanohub.org/resources/15979

  5. ECE 606 Lecture 35: MOSFET I-V Characteristics I

    16 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5900

  6. ECE 606 Lecture 36: MOSFET I-V Characteristics II

    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5902

  7. FETToy

    14 Feb 2006 | Tools | Contributor(s): Anisur Rahman, Jing Wang, Jing Guo, Md. Sayed Hasan, Yang Liu, Akira Matsudaira, Shaikh S. Ahmed, Supriyo Datta, Mark Lundstrom

    Calculate the ballistic I-V characteristics for conventional MOSFETs, Nanowire MOSFETs and Carbon NanoTube MOSFETs

    https://nanohub.org/resources/fettoy

  8. Illinois ECE 440: MOS Field-Effect Transistor Homework

    28 Jan 2010 | Teaching Materials | Contributor(s): Mohamed Mohamed

    This homework covers Output Characteristics and Mobility Model of MOSFETs.

    https://nanohub.org/resources/8268

  9. Illinois ECE 440: znipolar Junction Transistor (BJT) Homework

    28 Jan 2010 | Teaching Materials | Contributor(s): Mohamed Mohamed

    This homework covers BJT Fundamentals, Minority Carrier Distribution, and Terminal Currents.

    https://nanohub.org/resources/8278

  10. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

    https://nanohub.org/resources/10387

  11. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10388

  12. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10389

  13. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10390

  14. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10391

  15. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10392

  16. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10430

  17. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Theory of Operation and Measurement Overview

    https://nanohub.org/resources/10431

  18. Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    https://nanohub.org/resources/10432

  19. Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    Measurement Techniques and Optimization

    https://nanohub.org/resources/10433

  20. Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting

    20 Jan 2011 | Online Presentations | Contributor(s): Lee Stauffer

    https://nanohub.org/resources/10480

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