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Simulation and Admittance Analysis for Advanced Metal-Insulator-Semiconductor Characterization
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23 Feb 2014 | Tools | Contributor(s): Alex Grede
Non-parabolic DOS simulation of III-V MISCAPs with impurity ionization effects and ability to view components of channel capacitance.
MOSCAP CV profiling
05 Jan 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra
This real life problem based on MOSCAP allows one to understand the usage of CV profiling of MOS type of devices.
Tutorial for PADRE Based Simulation Tools
10 Aug 2009 | Teaching Materials | Contributor(s): Dragica Vasileska, Gerhard Klimeck
This tutorial is intended for first time and medium level users of PADRE-based simulation modules installed on the nanohub. It gives clear overview on the capabilities of each tool with emphasis...
Exercise for MOS Capacitors: CV curves and interface and Oxide Charges
03 Aug 2009 | Teaching Materials | Contributor(s): Dragica Vasileska, Gerhard Klimeck
This exercise is designed to teach the students how the CV curves of an ideal MOS Capacitor change in the presence of oxide or interface charges.
MOSCAP: Theoretical Exercise - High Frequency CV Curves
07 Jul 2009 | Teaching Materials | Contributor(s): Dragica Vasileska
One is required to sketch the high frequency CV curves for different MOS Capacitors configurations.
MOSCap: First-Time User Guide
30 Mar 2009 | Teaching Materials | Contributor(s): SungGeun Kim, Benjamin P Haley, Gerhard Klimeck
This first-time user guide provides an introduction to MOSCap. The MOSCap tool simulates the one-dimensional (along the growth direction) electrostatics in typical single and dual-gate...