Description

Courses (1-10 of 10)

1. NACK Unit 6: Basic Characterization Techniques

   19 Jul 2018 | | Contributor(s):: NACK Network

   This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.

2. [Illinois] ECE 564: Modern Light Microscopy

   11 Apr 2016 | | Contributor(s):: Gabriel Popescu

   Current research topics in modern light microscopy: optics principles (statistical optics, Gaussian optics, elastic light scattering, dynamic light scattering); traditional microscopy (bright field, dark field, DIC, phase contract, confocal, epi-fluorescence, confocal fluorescence); current...

3. [Illinois] ECE 564 Modern Light Microscopy

   25 Apr 2012 | | Contributor(s):: Gabriel Popescu

4. Illinois ECE 460 Optical Imaging

   03 Nov 2011 | | Contributor(s):: Gabriel Popescu

   Introduction to visible and infrared imaging systems covering fields, optical elements, electronic sensors, and embedded processing systems. Lectures and labs cover active and passive illumination, ranging, holography, polarization, coherence, spectroscopy, and sampling with an emphasis on...

5. Device Characterization with the Keithley 4200-SCS

   20 Jan 2011 | | Contributor(s):: Lee Stauffer

   This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

6. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

   01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

   Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

7. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)

   03 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman

   A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

8. Illinois ECE 460 Principles of Optical Imaging (Fall 2008)

   out of 5 stars 

   30 Jul 2008 | | Contributor(s):: Gabriel Popescu

   Introduction to visible and infrared imaging systems covering fields, optical elements, electronic sensors, and embedded processing systems. Lectures and labs cover active and passive illumination, ranging, holography, polarization, coherence, spectroscopy, and sampling with an emphasis on...

9. MSE 640 Transmission Electron Microscopy and Crystalline Imperfections

   out of 5 stars 

   25 Feb 2008 | | Contributor(s):: Eric Stach

10. MSE 582 Transmission Electron Microscopy Skills

    out of 5 stars 

    28 Jan 2008 | | Contributor(s):: Eric Stach

    Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.