All Categories (1-3 of 3)

1. Basic Characterization Techniques

   24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

   OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle

2. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

   20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

   OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

3. 

   Sean M Rinehart

   https://nanohub.org/members/130456