Tags: reliability

Online Presentations (81-89 of 89)

  1. Lecture 4: Stick Percolation and Nanonet Electronics

    26 Oct 2009 | | Contributor(s):: Muhammad A. Alam

    Outline:Stick percolation and nanonet transistorsShort channel nanonet transistorsLong channel nanonet transistorsTransistors at high voltagesConclusions

  2. Lecture 1: Percolation and Reliability of Electronic Devices

    17 Sep 2009 | | Contributor(s):: Muhammad A. Alam

  3. Lecture 2: Threshold, Islands, and Fractals

    17 Sep 2009 | | Contributor(s):: Muhammad A. Alam

  4. Lecture 3: Electrical Conduction in Percolative Systems

    17 Sep 2009 | | Contributor(s):: Muhammad A. Alam

  5. The Challenges of Micro-System Product Development

    05 Jun 2009 | | Contributor(s):: James J. Allen

    This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

  6. ECE 606 Lecture 39: Reliability of MOSFET

    28 Apr 2009 | | Contributor(s):: Muhammad A. Alam

  7. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    13 Mar 2009 | | Contributor(s):: Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional representations of stochastic variability and to achieve exponential convergence rates in statistics of...

  8. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    14 Nov 2008 | | Contributor(s):: Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

  9. From density functional theory to defect level in silicon: Does the “band gap problem” matter?

    01 Oct 2008 | | Contributor(s):: Peter A. Schultz

    Modeling the electrical effects of radiation damage in semiconductor devices requires a detailed description of the properties of point defects generated during and subsequent to irradiation. Such modeling requires physical parameters, such as defect electronic levels, to describe carrier...