Tags: reliability

Online Presentations (81-88 of 88)

  1. Lecture 1: Percolation and Reliability of Electronic Devices

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7169

  2. Lecture 2: Threshold, Islands, and Fractals

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7170

  3. Lecture 3: Electrical Conduction in Percolative Systems

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7171

  4. The Challenges of Micro-System Product Development

    05 Jun 2009 | Online Presentations | Contributor(s): James J. Allen

    This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

    https://nanohub.org/resources/6848

  5. ECE 606 Lecture 39: Reliability of MOSFET

    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5908

  6. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    13 Mar 2009 | Online Presentations | Contributor(s): Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional...

    https://nanohub.org/resources/5910

  7. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    14 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

    https://nanohub.org/resources/5861

  8. From density functional theory to defect level in silicon: Does the “band gap problem” matter?

    01 Oct 2008 | Online Presentations | Contributor(s): Peter A. Schultz

    Modeling the electrical effects of radiation damage in semiconductor devices requires a detailed description of the properties of point defects generated during and subsequent to irradiation....

    https://nanohub.org/resources/5495