Tags: reliability

Papers (1-1 of 1)

  1. Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

    30 Sep 2011 | Contributor(s):: Ahmad Ehteshamul Islam

    Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of the basic building blocks in almost all the modern electronic devices. However, nanoscale dimensions...