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Jul 20 2009
2009 NCN@Purdue Summer School: Electronics from the Bottom Up
Electronics from the Bottom Up seeks to bring a new perspective to engineering education -- one that is designed to help realize the opportunities of nanotechnology. Ever since the birth of...
https://nanohub.org/events/details/231
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2009 NCN@Purdue Summer School: Electronics from the Bottom Up
22 Sep 2009 | Workshops | Contributor(s): Supriyo Datta, Mark Lundstrom, Muhammad A. Alam, Joerg Appenzeller
The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on...
https://nanohub.org/resources/7113
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A Blind Fish in a River with a Waterfall
31 Jul 2014 | Tools | Contributor(s): Muhammad Alam, Sajia Sadeque
Prototype for a reliability problem defined as Stochastic Process with a Threshold
https://nanohub.org/resources/fishandriver
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A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells
16 Aug 2011 | Online Presentations | Contributor(s): Sourabh Dongaonkar, Souvik Mahapatra, Karthik Yogendra, Muhammad Alam
In this talk we develop a coherent physics based understanding of the shunt leakage problem in a-Si:H cells, and discuss its implications on cell and module level.
Sourabh Dongaonkar is with...
https://nanohub.org/resources/11841
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Ali Aldubaisi
https://nanohub.org/members/88716
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ECE 606 Lecture 39: Reliability of MOSFET
28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
https://nanohub.org/resources/5908
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ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET
14 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam
Guest lecturer: Muhammad A. Alam.
https://nanohub.org/resources/5861
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ECE 695A Lecture 10: NBTI Time Dependence -- Frequency and Duty Cycle Dependencies
06 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
NBTI stress and relaxation by R-D model
Frequency independence and lifetime projection
Duty cycle dependence
The magic of measurement
Conclusions
https://nanohub.org/resources/16668
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ECE 695A Lecture 10A: Appendix - Reflection on R-D Equation
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
https://nanohub.org/resources/16787
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ECE 695A Lecture 11: Temperature Dependence of NBTI
07 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Review: Temperature activation & NBTI
Temperature dependent forward/reverse rates
Temperature dependence of diffusion coefficient
Material dependence of activation...
https://nanohub.org/resources/16774
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ECE 695A Lecture 11R: Review Questions
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Does Einstein relationship hold for activated diffusion?
People argue that the forward dissociation and reverse passivation have similar activation barriers. Would you...
https://nanohub.org/resources/16786
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ECE 695A Lecture 12: Field Dependence of NBTI
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Background: Field dependent degradation
Components of field-dependent dissociation:
Interpreting experiments
Voltage acceleration factors
Conclusion
https://nanohub.org/resources/16789
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ECE 695A Lecture 12R: Review Questions
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Explain the difference between local field and global field within an oxide.
Explain physically why electric field decreases bond strength.
How does the dissociation...
https://nanohub.org/resources/16790
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ECE 695A Lecture 13: Introductory Lecture on HCI Degradation
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Background and features of HCI Degradation
Phenomenological observations
Origin of Hot carriers
Theory of Si-H Bond Dissociation
Theory of Si-O Bond...
https://nanohub.org/resources/16887
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ECE 695A Lecture 13R: Review Questions
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Both SiH and SiO are involved in HCI degradation. Give two evidences.
Why doesn’t HCI occur during NBTI stress condition?
I suggested that HCI curve can shifted...
https://nanohub.org/resources/16888
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ECE 695A Lecture 14a: Voltage Dependent HCI I
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Background and Empirical Observations
Theory of Hot Carriers: Hydrodynamic Model
Theory of Hot Carriers: Monte Carlo Model
Theory of Hot Carriers: Universal...
https://nanohub.org/resources/16895
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ECE 695A Lecture 14b: Voltage Dependent HCI II
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
Background and Empirical Observations
Theory of Hot Carriers: Hydrodynamic Model
Theory of Hot Carriers: Monte Carlo Model
Theory of Hot Carriers: Universal...
https://nanohub.org/resources/16896
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ECE 695A Lecture 14R: Review Questions
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions
Why is Isub called a thermometer of hot electron distribution? Why can you not simply measure hot electrons by looking at the drain current?
What are the three methods of...
https://nanohub.org/resources/16897
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ECE 695A Lecture 15: Off-state HCI Degradation
19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:
ON vs. OFF State HCI Degradation
Origin of hot carriers at off-state
SiH vs. SiO – who is getting broken? Voltage acceleration factors by scaling
Conclusions
https://nanohub.org/resources/16919
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ECE 695A Lecture 15R: Review Questions
20 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:
Why is BTBT tunneling important for OFF-state HCI, but nor for ON-state HCI?
What type of bond dissociation dominated DeMOS degradation? Provide two supporting arguments....
https://nanohub.org/resources/16933