Tags: reliability

All Categories (61-80 of 105)

  1. ECE 695A Lecture 11: Temperature Dependence of NBTI

    07 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Review: Temperature activation & NBTI Temperature dependent forward/reverse rates Temperature dependence of diffusion coefficient Material dependence of activation...

    https://nanohub.org/resources/16774

  2. ECE 695A Lecture 10: NBTI Time Dependence -- Frequency and Duty Cycle Dependencies

    06 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: NBTI stress and relaxation by R-D model Frequency independence and lifetime projection Duty cycle dependence The magic of measurement Conclusions

    https://nanohub.org/resources/16668

  3. ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase

    06 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Background: Time-dependent degradation The Reaction-Diffusion model Approximate solution to R-D model in stress phase Degradation free transistors Conclusions

    https://nanohub.org/resources/16667

  4. ECE 695A Lecture 6: Defects in the Bulk and at Interfaces

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Strain in materials/origin of defects Examples: bulk defects Examples: interface defects Measurements Conclusions

    https://nanohub.org/resources/16608

  5. ECE 695A Lecture 8: Phenomenological Observations for NBTI

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Qualitative observations Time, voltage, temperature dependencies Material dependence Circuit implications

    https://nanohub.org/resources/16665

  6. ECE 695A Lecture 8R: Review Questions

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    What is the distinction between BTI and NBTI phenomena? What does it mean that a process is thermally activated? What is the difference between parametric failure and catastrophic failure?...

    https://nanohub.org/resources/16666

  7. ECE 695A Lecture 5: Amorphous Material/Interfaces

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Amorphous vs. crystalline materials Defect-free amorphous material Origin of defects (Maxwell’s relation) Conclusions

    https://nanohub.org/resources/16548

  8. ECE 695A Lecture 7: Trapping in Pre-existing Traps

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Pre-existing vs. stress-induced traps Voltage-shift in pre-existing bulk/interface traps Random Telegraph Noise, 1/f noise Conclusion

    https://nanohub.org/resources/16609

  9. ECE 695A Lecture 7A: Appendix - Theory of Stochastic Distribution

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Supplemental information for Lecture 7: Trapping in Pre-existing Traps

    https://nanohub.org/resources/16611

  10. ECE 695A Lecture 7R: Review Questions

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why are there more types of defects in crystals than in amorphous material? From the perspective of Maxwell’s relation, how does H reduce defect density? Why is HfO2 so...

    https://nanohub.org/resources/16615

  11. ECE 695A Lecture 3: Reliability as a Threshold Problem

    17 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Reliability as a Threshold Problem: Empirical vs. Physical Models ‘Blind Fish in a Waterfall’ as a prototype for Accelerated Testing/Statistical distribution Four elements of...

    https://nanohub.org/resources/16546

  12. ECE 695A Lecture 4: Structures and Defects in Crystals

    17 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Background information Defect-free crystal structures Defects in crystals Conclusions

    https://nanohub.org/resources/16547

  13. ECE 695A Reliability Physics of Nanotransistors

    17 Jan 2013 | Courses | Contributor(s): Muhammad Alam

    This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, the students learn how to compute current through a device when a...

    https://nanohub.org/resources/16560

  14. ECE 695A Lecture 2: A Brief History of Reliability and Types of Reliability Models

    16 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Reliability as a General Phenomena A Brief History of Reliability Approaches to Reliability Physics Conclusions

    https://nanohub.org/resources/16545

  15. ECE 695A Lecture 1: Reliability of Nanoelectronic Devices

    11 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Evolving Landscape of Electronics Performance, Variability, and Reliability Classification of Reliability Course Information Conclusions

    https://nanohub.org/resources/16511

  16. In Search of a Better MEMS-Switch: An Elementary theory of how nanostructured dielectrics may soften landing, increase travel range, and decrease energy dissipation

    06 Jun 2012 | Online Presentations | Contributor(s): Muhammad Alam

    In this talk, I will discuss an elementary theory of the role of nanostructured electrodes in addressing some of the challenges from a fundamentally different perspective. The goal is to start a...

    https://nanohub.org/resources/13899

  17. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13613

  18. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    https://nanohub.org/resources/13614

  19. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13612

  20. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it...

    https://nanohub.org/resources/13611