Tags: reliability

All Categories (81-100 of 105)

  1. Verification and Validation in Simulations of Complex Engineered Systems

    03 Jan 2012 | Online Presentations | Contributor(s): Robert Moser

    Computational simulation is a ubiquitous tool in engineering. Further, the explosion of computational capabilities over the last several decades has resulted in the use of computational models of...

    https://nanohub.org/resources/12525

  2. Jeremy M Gernand

    Jeremy Gernand is currently an Assistant Professor of Industrial Health and Safety at Penn State University. He is currently pursuing research related to the occupational hazards of exposure to...

    https://nanohub.org/members/61288

  3. Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

    30 Sep 2011 | Papers | Contributor(s): Ahmad Ehteshamul Islam

    Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...

    https://nanohub.org/resources/12182

  4. A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells

    16 Aug 2011 | Online Presentations | Contributor(s): Sourabh Dongaonkar, Souvik Mahapatra, Karthik Yogendra, Muhammad Alam

    In this talk we develop a coherent physics based understanding of the shunt leakage problem in a-Si:H cells, and discuss its implications on cell and module level. Sourabh Dongaonkar is with...

    https://nanohub.org/resources/11841

  5. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...

    https://nanohub.org/resources/11249

  6. Lecture 9: Breakdown in Thick Dielectrics

    05 Apr 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Breakdown in gas dielectric and Paschen’s law Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Theory of pre-existing defects: Thin oxides Theory of...

    https://nanohub.org/resources/7177

  7. Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

    10 Mar 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/7176

  8. Lecture 10: Interface Damage & Negative Bias Temperature Instability

    02 Feb 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Background information NBTI interpreted by R-D model The act of measurement and observed quantity NBTI vs. Light-induced Degradation Possibility of Degradation-free...

    https://nanohub.org/resources/7178

  9. Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells

    27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Introduction: 

definitions
 and
 review
 Reaction
 diffusion
 in 
fractal 
volumes Carrier
 transport
 in 
BH
 solar 
cells All
 phase
 transitions 
are
 not
 fractal Conclusions

    https://nanohub.org/resources/7174

  10. Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae

    27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Background:
 A
 different
 type
 of
 transport
 problem
 Example:
 Classical
 biosensors Fractal 
dimension
 and
 cantor
 transform Example:
 fractal...

    https://nanohub.org/resources/7173

  11. Lecture 4: Stick Percolation and Nanonet Electronics

    26 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Stick percolation and nanonet transistors Short channel nanonet transistors Long channel nanonet transistors Transistors at high voltages Conclusions

    https://nanohub.org/resources/7172

  12. 2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    22 Sep 2009 | Workshops | Contributor(s): Supriyo Datta, Mark Lundstrom, Muhammad A. Alam, Joerg Appenzeller

    The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on...

    https://nanohub.org/resources/7113

  13. Lecture 1: Percolation and Reliability of Electronic Devices

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7169

  14. Lecture 2: Threshold, Islands, and Fractals

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7170

  15. Lecture 3: Electrical Conduction in Percolative Systems

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7171

  16. Nanostructured Electronic Devices: Percolation and Reliability

    17 Sep 2009 | Courses | Contributor(s): Muhammad A. Alam

    In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all...

    https://nanohub.org/resources/7168

  17. Jul 20 2009

    2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    Electronics from the Bottom Up seeks to bring a new perspective to engineering education -- one that is designed to help realize the opportunities of nanotechnology. Ever since the birth of...

    https://nanohub.org/events/details/231

  18. The Challenges of Micro-System Product Development

    05 Jun 2009 | Online Presentations | Contributor(s): James J. Allen

    This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

    https://nanohub.org/resources/6848

  19. ECE 606 Lecture 39: Reliability of MOSFET

    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/5908

  20. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    13 Mar 2009 | Online Presentations | Contributor(s): Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional...

    https://nanohub.org/resources/5910