Tags: reliability

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  1. Jul 20 2009

    2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    Electronics from the Bottom Up seeks to bring a new perspective to engineering education -- one that is designed to help realize the opportunities of nanotechnology. Ever since the birth of...

    https://nanohub.org/events/details/231

  2. 2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    22 Sep 2009 | | Contributor(s):: Supriyo Datta, Mark Lundstrom, Muhammad A. Alam, Joerg Appenzeller

    The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on laboratory session will be available in the afternoons.

  3. A Blind Fish in a River with a Waterfall

    23 Mar 2010 | | Contributor(s):: Muhammad Alam, Sajia Sadeque

    Prototype for a reliability problem defined as Stochastic Process with a Threshold

  4. A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells

    15 Aug 2011 | | Contributor(s):: Sourabh Dongaonkar, Souvik Mahapatra, Karthik Yogendra, Muhammad Alam

    In this talk we develop a coherent physics based understanding of the shunt leakage problem in a-Si:H cells, and discuss its implications on cell and module level.Sourabh Dongaonkar is with School of Electrical and Computer Engineering, Purdue University, West Lafayette, INKarthik Y and Souvik...

  5. Ali Aldubaisi

    https://nanohub.org/members/88716

  6. ECE 606 Lecture 39: Reliability of MOSFET

    28 Apr 2009 | | Contributor(s):: Muhammad A. Alam

  7. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    14 Nov 2008 | | Contributor(s):: Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

  8. ECE 695A Lecture 10: NBTI Time Dependence -- Frequency and Duty Cycle Dependencies

    06 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:NBTI stress and relaxation by R-D modelFrequency independence and lifetime projectionDuty cycle dependenceThe magic of measurementConclusions

  9. ECE 695A Lecture 10A: Appendix - Reflection on R-D Equation

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

  10. ECE 695A Lecture 11: Temperature Dependence of NBTI

    07 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Review: Temperature activation & NBTITemperature dependent forward/reverse ratesTemperature dependence of diffusion coefficientMaterial dependence of activation energyConclusion

  11. ECE 695A Lecture 11R: Review Questions

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Does Einstein relationship hold for activated diffusion?People argue that the forward dissociation and reverse passivation have similar activation barriers. Would you support the argument?What assumption did I make regarding diffusion of H in SiO2 that makes the derivation...

  12. ECE 695A Lecture 12: Field Dependence of NBTI

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Background: Field dependent degradationComponents of field-dependent dissociation:Interpreting experimentsVoltage acceleration factorsConclusion

  13. ECE 695A Lecture 12R: Review Questions

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Explain the difference between local field and global field within an oxide. Explain physically why electric field decreases bond strength.How does the dissociation process becomes non-Arrhenius?Do you think the diffusion and repassivation will also become non-Arrhenius when...

  14. ECE 695A Lecture 13: Introductory Lecture on HCI Degradation

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Background and features of HCI DegradationPhenomenological observationsOrigin of Hot carriersTheory of Si-H Bond DissociationTheory of Si-O Bond DissociationConclusions

  15. ECE 695A Lecture 13R: Review Questions

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Both SiH and SiO are involved in HCI degradation. Give two evidences.Why doesn’t HCI occur during NBTI stress condition?I suggested that HCI curve can shifted horizontally to form a universal curve, do you believe that I can do a corresponding vertical shift to form the...

  16. ECE 695A Lecture 14a: Voltage Dependent HCI I

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Background and Empirical ObservationsTheory of Hot Carriers: Hydrodynamic ModelTheory of Hot Carriers: Monte Carlo ModelTheory of Hot Carriers: Universal ScalingConclusionAppendices

  17. ECE 695A Lecture 14b: Voltage Dependent HCI II

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Background and Empirical ObservationsTheory of Hot Carriers: Hydrodynamic ModelTheory of Hot Carriers: Monte Carlo ModelTheory of Hot Carriers: Universal ScalingConclusionAppendices

  18. ECE 695A Lecture 14R: Review Questions

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review QuestionsWhy is Isub called a thermometer of hot electron distribution? Why can you not simply measure hot electrons by looking at the drain current?What are the three methods of HCI voltage acceleration?If theory of universal scaling is so good, why not use it all the time? (Hint: Think...

  19. ECE 695A Lecture 15: Off-state HCI Degradation

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:ON vs. OFF State HCI DegradationOrigin of hot carriers at off-stateSiH vs. SiO – who is getting broken? Voltage acceleration factors by scalingConclusions

  20. ECE 695A Lecture 15R: Review Questions

    20 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Why is BTBT tunneling important for OFF-state HCI, but nor for ON-state HCI?What type of bond dissociation dominated DeMOS degradation? Provide two supporting arguments. Will universality hold of SiH and SiO bond dissociation occur in equal proportion?Do you expect NBTI to be...