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Tags: reliability

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  1. ECE 695A Lecture 37: Radiation Induced Damage – An overview

    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction and short history of radiation damage Radiation damage in various types of components Sources of radiation A basic calculation and simulation...

    https://nanohub.org/resources/17638

  2. ECE 695A Lecture 37R: Review Questions

    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET? What type of radiation issues could arise for thin-body...

    https://nanohub.org/resources/17639

  3. ECE 695A Lecture 3: Reliability as a Threshold Problem

    17 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Reliability as a Threshold Problem: Empirical vs. Physical Models ‘Blind Fish in a Waterfall’ as a prototype for Accelerated Testing/Statistical distribution Four elements of...

    https://nanohub.org/resources/16546

  4. ECE 695A Lecture 4: Structures and Defects in Crystals

    17 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Background information Defect-free crystal structures Defects in crystals Conclusions

    https://nanohub.org/resources/16547

  5. ECE 695A Lecture 5: Amorphous Material/Interfaces

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Amorphous vs. crystalline materials Defect-free amorphous material Origin of defects (Maxwell’s relation) Conclusions

    https://nanohub.org/resources/16548

  6. ECE 695A Lecture 5R: Review Questions

    12 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the difference between coordination and composition? Is periodicity essential for a defect-free structure? Why can’t the amorphous material have arbitrary ring...

    https://nanohub.org/resources/16788

  7. ECE 695A Lecture 6: Defects in the Bulk and at Interfaces

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Strain in materials/origin of defects Examples: bulk defects Examples: interface defects Measurements Conclusions

    https://nanohub.org/resources/16608

  8. ECE 695A Lecture 7: Trapping in Pre-existing Traps

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Pre-existing vs. stress-induced traps Voltage-shift in pre-existing bulk/interface traps Random Telegraph Noise, 1/f noise Conclusion

    https://nanohub.org/resources/16609

  9. ECE 695A Lecture 7A: Appendix - Theory of Stochastic Distribution

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Supplemental information for Lecture 7: Trapping in Pre-existing Traps

    https://nanohub.org/resources/16611

  10. ECE 695A Lecture 7R: Review Questions

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why are there more types of defects in crystals than in amorphous material? From the perspective of Maxwell’s relation, how does H reduce defect density? Why is HfO2 so...

    https://nanohub.org/resources/16615

  11. ECE 695A Lecture 8: Phenomenological Observations for NBTI

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Qualitative observations Time, voltage, temperature dependencies Material dependence Circuit implications

    https://nanohub.org/resources/16665

  12. ECE 695A Lecture 8R: Review Questions

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    What is the distinction between BTI and NBTI phenomena? What does it mean that a process is thermally activated? What is the difference between parametric failure and catastrophic failure?...

    https://nanohub.org/resources/16666

  13. ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase

    06 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Background: Time-dependent degradation The Reaction-Diffusion model Approximate solution to R-D model in stress phase Degradation free transistors Conclusions

    https://nanohub.org/resources/16667

  14. ECE 695A Lecture 9R: Review Questions

    08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Does NBTI power-exponent depend on voltage or temperature? Do you expect the NBTI power-exponent to be larger or smaller if trapping is important? How does one know that...

    https://nanohub.org/resources/16778

  15. ECE 695A Reliability Physics of Nanotransistors

    17 Jan 2013 | Courses | Contributor(s): Muhammad Alam

    This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, the students learn how to compute current through a device when a...

    https://nanohub.org/resources/16560

  16. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    13 Mar 2009 | Online Presentations | Contributor(s): Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional...

    https://nanohub.org/resources/5910

  17. From density functional theory to defect level in silicon: Does the “band gap problem” matter?

    01 Oct 2008 | Online Presentations | Contributor(s): Peter A. Schultz

    Modeling the electrical effects of radiation damage in semiconductor devices requires a detailed description of the properties of point defects generated during and subsequent to irradiation....

    https://nanohub.org/resources/5495

  18. In Search of a Better MEMS-Switch: An Elementary theory of how nanostructured dielectrics may soften landing, increase travel range, and decrease energy dissipation

    06 Jun 2012 | Online Presentations | Contributor(s): Muhammad Alam

    In this talk, I will discuss an elementary theory of the role of nanostructured electrodes in addressing some of the challenges from a fundamentally different perspective. The goal is to start a...

    https://nanohub.org/resources/13899

  19. Jeremy M Gernand

    Jeremy Gernand is currently an Assistant Professor of Industrial Health and Safety at Penn State University. He is currently pursuing research related to the occupational hazards of exposure to...

    https://nanohub.org/members/61288

  20. Lecture 10: Interface Damage & Negative Bias Temperature Instability

    02 Feb 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Background information NBTI interpreted by R-D model The act of measurement and observed quantity NBTI vs. Light-induced Degradation Possibility of Degradation-free...

    https://nanohub.org/resources/7178

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