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ECE 695A Lecture 32R: Review Questions
17 Apr 2013 | | Contributor(s):: Muhammad Alam
Review Questions:Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution?What is the problem of using empirical distributions? What are the advantages?If you must choose an empirical distribution, what should be your criteria? (Nos. of...
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ECE 695A Lecture 33: Model Selection/Goodness of Fit
18 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:The problem of matching data with theoretical distributionParameter extractions: Moments, linear regression, maximum likelihoodGoodness of fit: Residual, Pearson, Cox, AkikaConclusion
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ECE 695A Lecture 33R: Review Questions
18 Apr 2013 | | Contributor(s):: Muhammad Alam
Review Questions:With higher number of model parameters, you can always get a good fit – why should you minimize the number of parametersLeast square method is a subset of maximum likelihood approach to data fitting. Is this statement correct?What aspect of the distribution function does...
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ECE 695A Lecture 34: Scaling Theory of Design of Experiments
18 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:IntroductionBuckingham PI TheoremAn Illustrative ExampleRecall the scaling theory of HCI, NBTI, and TDDBConclusions
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ECE 695A Lecture 34A: Appendix - Variability by Bootstrap Method
18 Apr 2013 | | Contributor(s):: Muhammad Alam
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ECE 695A Lecture 37: Radiation Induced Damage – An overview
20 Apr 2013 | | Contributor(s):: Muhammad Alam
Outline:Introduction and short history of radiation damageRadiation damage in various types of componentsSources of radiationA basic calculation and simulation approachesConclusions
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ECE 695A Lecture 37R: Review Questions
20 Apr 2013 | | Contributor(s):: Muhammad Alam
Review Questions:Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?What type of radiation issues could arise for thin-body devices like FINFET?What is error correction code? Why does it correct for MBU?What is the difference between SEE...
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ECE 695A Lecture 3: Reliability as a Threshold Problem
17 Jan 2013 | | Contributor(s):: Muhammad Alam
Outline:Reliability as a Threshold Problem: Empirical vs. Physical Models‘Blind Fish in a Waterfall’ as a prototype for Accelerated Testing/Statistical distributionFour elements of Physical ReliabilityConclusions
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ECE 695A Lecture 4: Structures and Defects in Crystals
17 Jan 2013 | | Contributor(s):: Muhammad Alam
Outline:Background informationDefect-free crystal structuresDefects in crystalsConclusions
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ECE 695A Lecture 5: Amorphous Material/Interfaces
29 Jan 2013 | | Contributor(s):: Muhammad Alam
Outline:Amorphous vs. crystalline materialsDefect-free amorphous materialOrigin of defects (Maxwell’s relation)Conclusions
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ECE 695A Lecture 5R: Review Questions
12 Feb 2013 | | Contributor(s):: Muhammad Alam
Review Questions:What is the difference between coordination and composition?Is periodicity essential for a defect-free structure?Why can’t the amorphous material have arbitrary ring distribution?How does Temperature enter in Maxwell’s relationship?Do you expect more or less defect for...
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ECE 695A Lecture 6: Defects in the Bulk and at Interfaces
01 Feb 2013 | | Contributor(s):: Muhammad Alam
Outline:Strain in materials/origin of defectsExamples: bulk defectsExamples: interface defectsMeasurementsConclusions
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ECE 695A Lecture 7: Trapping in Pre-existing Traps
29 Jan 2013 | | Contributor(s):: Muhammad Alam
Outline:Pre-existing vs. stress-induced trapsVoltage-shift in pre-existing bulk/interface trapsRandom Telegraph Noise, 1/f noiseConclusion
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ECE 695A Lecture 7A: Appendix - Theory of Stochastic Distribution
29 Jan 2013 | | Contributor(s):: Muhammad Alam
Supplemental information for Lecture 7: Trapping in Pre-existing Traps
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ECE 695A Lecture 7R: Review Questions
29 Jan 2013 | | Contributor(s):: Muhammad Alam
Review Questions:Why are there more types of defects in crystals than in amorphous material?From the perspective of Maxwell’s relation, how does H reduce defect density?Why is HfO2 so defective --- and why do you want to use it?Which type of traps involve faster trapping/detrapping, Pb center or...
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ECE 695A Lecture 8: Phenomenological Observations for NBTI
01 Feb 2013 | | Contributor(s):: Muhammad Alam
Outline:Qualitative observationsTime, voltage, temperature dependenciesMaterial dependenceCircuit implications
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ECE 695A Lecture 8R: Review Questions
01 Feb 2013 | | Contributor(s):: Muhammad Alam
What is the distinction between BTI and NBTI phenomena?What does it mean that a process is thermally activated?What is the difference between parametric failure and catastrophic failure? Give examples. What are the time-characteristics of trapping, BTI, and NBTI?Which device will have poorer NBTI...
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ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase
06 Feb 2013 | | Contributor(s):: Muhammad Alam
Outline:Background: Time-dependent degradationThe Reaction-Diffusion modelApproximate solution to R-D model in stress phaseDegradation free transistorsConclusions
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ECE 695A Lecture 9R: Review Questions
08 Feb 2013 | | Contributor(s):: Muhammad Alam
Review Questions:Does NBTI power-exponent depend on voltage or temperature?Do you expect the NBTI power-exponent to be larger or smaller if trapping is important?How does one know that the diffusing species is neutral?How would the time-exponent different for a surround gate MOSFET vs. planar...
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ECE 695A Reliability Physics of Nanotransistors
Courses|'
09 Jul 2014
Instructor: Muhammad A. Alam
https://nanohub.org/courses/ece695a