Tags: reliability

All Categories (81-100 of 103)

  1. Lecture 1: Percolation and Reliability of Electronic Devices

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7169

  2. Lecture 2: Threshold, Islands, and Fractals

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7170

  3. Lecture 3: Electrical Conduction in Percolative Systems

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    https://nanohub.org/resources/7171

  4. Lecture 4: Stick Percolation and Nanonet Electronics

    26 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Stick percolation and nanonet transistors Short channel nanonet transistors Long channel nanonet transistors Transistors at high voltages Conclusions

    https://nanohub.org/resources/7172

  5. Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae

    27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Background:
 A
 different
 type
 of
 transport
 problem
 Example:
 Classical
 biosensors Fractal 
dimension
 and
 cantor
 transform Example:
 fractal...

    https://nanohub.org/resources/7173

  6. Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells

    27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Introduction: 

definitions
 and
 review
 Reaction
 diffusion
 in 
fractal 
volumes Carrier
 transport
 in 
BH
 solar 
cells All
 phase
 transitions...

    https://nanohub.org/resources/7174

  7. Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

    10 Mar 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    https://nanohub.org/resources/7176

  8. Lecture 9: Breakdown in Thick Dielectrics

    05 Apr 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Breakdown in gas dielectric and Paschen’s law Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Theory of pre-existing defects: Thin oxides Theory...

    https://nanohub.org/resources/7177

  9. Linfeng He

    https://nanohub.org/members/83280

  10. Modeling Interface-defect Generation (MIG)

    18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

    https://nanohub.org/resources/devrel

  11. Mohamed Tarek Ghoneim

    Keywords: device physics, flexible electronics, nanotechnology, graphene, nonvolatile memory, reliability, CMOS, physical and electrical characterization, emerging devices, power management, VLSI,...

    https://nanohub.org/members/77955

  12. Nanostructured Electronic Devices: Percolation and Reliability

    17 Sep 2009 | Courses | Contributor(s): Muhammad A. Alam

    In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all...

    https://nanohub.org/resources/7168

  13. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13613

  14. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...

    https://nanohub.org/resources/11249

  15. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    https://nanohub.org/resources/13614

  16. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    https://nanohub.org/resources/13612

  17. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it...

    https://nanohub.org/resources/13611

  18. PRISM Seminar Series

    05 Nov 2008 | Series | Contributor(s): Jayathi Murthy, Alejandro Strachan

    Welcome to the PRISM Seminar Series. PRIMS: NNSA Center for Prediction of Reliability, Integrity and Survivability of Microsystems, is a university center funded by the Department of Energy's...

    https://nanohub.org/resources/5699

  19. Reliability Physics of Nanoscale Transistors

    27 Nov 2007 | Courses | Contributor(s): Muhammad A. Alam

    This course is now offered on nanoHUB as ECE 695A Reliability Physics of Nanotransistors.

    https://nanohub.org/resources/3587

  20. The Challenges of Micro-System Product Development

    05 Jun 2009 | Online Presentations | Contributor(s): James J. Allen

    This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

    https://nanohub.org/resources/6848