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Lecture 1: Percolation and Reliability of Electronic Devices
17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
Network for Computational Nanotechnology,
Intel Foundation
https://nanohub.org/resources/7169
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Lecture 2: Threshold, Islands, and Fractals
17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
Network for Computational Nanotechnology,
Intel Foundation
https://nanohub.org/resources/7170
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Lecture 3: Electrical Conduction in Percolative Systems
17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
Network for Computational Nanotechnology,
Intel Foundation
https://nanohub.org/resources/7171
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Lecture 4: Stick Percolation and Nanonet Electronics
26 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline:
Stick percolation and nanonet transistors
Short channel nanonet transistors
Long channel nanonet transistors
Transistors at high voltages
Conclusions
https://nanohub.org/resources/7172
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Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae
27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline:
Background:
A
different
type
of
transport
problem
Example:
Classical
biosensors
Fractal
dimension
and
cantor
transform
Example:
fractal...
https://nanohub.org/resources/7173
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Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells
27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline:
Introduction:
definitions
and
review
Reaction
diffusion
in
fractal
volumes
Carrier
transport
in
BH
solar
cells
All
phase
transitions
are
not
fractal
Conclusions
https://nanohub.org/resources/7174
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Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown
10 Mar 2010 | Online Presentations | Contributor(s): Muhammad A. Alam
https://nanohub.org/resources/7176
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Lecture 9: Breakdown in Thick Dielectrics
05 Apr 2010 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline:
Breakdown in gas dielectric and Paschen’s law
Spatial and temporal dynamics during breakdown
Breakdown in bulk oxides: puzzle
Theory of pre-existing defects: Thin oxides
Theory of...
https://nanohub.org/resources/7177
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Linfeng He
https://nanohub.org/members/83280
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Modeling Interface-defect Generation (MIG)
18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam
Analyzes device reliability based on NBTI
https://nanohub.org/resources/devrel
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Nanostructured Electronic Devices: Percolation and Reliability
17 Sep 2009 | Courses | Contributor(s): Muhammad A. Alam
In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all...
https://nanohub.org/resources/7168
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling
28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...
https://nanohub.org/resources/13613
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)
11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...
https://nanohub.org/resources/11249
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)
28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra
https://nanohub.org/resources/13614
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)
28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra
This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...
https://nanohub.org/resources/13612
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)
28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra
This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it...
https://nanohub.org/resources/13611
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PRISM Seminar Series
05 Nov 2008 | Series | Contributor(s): Jayathi Murthy, Alejandro Strachan
Welcome to the PRISM Seminar Series.
PRIMS: NNSA Center for Prediction of Reliability, Integrity and Survivability of Microsystems, is a university center funded by the Department of Energy's...
https://nanohub.org/resources/5699
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Reliability Physics of Nanoscale Transistors
27 Nov 2007 | Courses | Contributor(s): Muhammad A. Alam
This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, we learn how to compute current through a device when a voltage is...
https://nanohub.org/resources/3587
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The Challenges of Micro-System Product Development
05 Jun 2009 | Online Presentations | Contributor(s): James J. Allen
This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.
https://nanohub.org/resources/6848
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Theory and characterization of random defect formation and its implication in variability of nanoscale transistors
30 Sep 2011 | Papers | Contributor(s): Ahmad Ehteshamul Islam
Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...
https://nanohub.org/resources/12182
