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Tags: reliability

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  1. ECE 695A Lecture 16: Review Questions

    22 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Question What is the difference between hot atom dissociation vs. cold atom dissociation?. Many experiments are reported at 77K and 295K. Why these temperatures?. Why is there such...

    https://nanohub.org/resources/17014

  2. ECE 695A Lecture 16: Temperature Dependence of HCI

    19 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Empirical observations regarding HCI Theory of bond dissociation: MVE vs. RRK Hot carrier dissociation of SiH bonds Hot carrier dissociation of SiO bonds Conclusions

    https://nanohub.org/resources/16920

  3. ECE 695A Lecture 17: Subthreshold and Idlin Methods

    21 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    https://nanohub.org/resources/16965

  4. ECE 695A Lecture 17R: Review Questions

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation? Why do people like to use C-V techniques? What method would you use for HCI...

    https://nanohub.org/resources/17155

  5. ECE 695A Lecture 18: DC-IV and Charge Pumping Methods

    25 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Recall: Properties of Interface Defects Flux-based method 1: Direct Current-Voltage method Flux-based method 2: Charge pumping method Conclusions

    https://nanohub.org/resources/17023

  6. ECE 695A Lecture 18R: Review Questions

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Between DCIV and CP methods, which one is easier and why? In what ways are CP and DCIV methods better at characterizing traps compared to C-V methods? What are the...

    https://nanohub.org/resources/17159

  7. ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Importance of measuring interface damage Electronic Spin Resonance ( A quick review) Spin Dependent Recombination Electrically detected spin-resonance and noise-...

    https://nanohub.org/resources/17024

  8. ECE 695A Lecture 19R: Review Questions

    04 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions:: If a signal disappears from ESR because of negative-U configuration, can it be detected by SDR or EDSR methods? What is the relationship between Gauss and Tesla as units...

    https://nanohub.org/resources/17196

  9. ECE 695A Lecture 1: Reliability of Nanoelectronic Devices

    11 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Evolving Landscape of Electronics Performance, Variability, and Reliability Classification of Reliability Course Information Conclusions

    https://nanohub.org/resources/16511

  10. ECE 695A Lecture 21: Introduction to Dielectric Breakdown

    05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Basic features of gate dielectric breakdown Physical characterization of breakdown spot Time-dependent defect generation Conclusions

    https://nanohub.org/resources/17027

  11. ECE 695A Lecture 21R: Review Questions

    12 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the name of the failure distribution that we expect for thin oxides? For thin oxides, is PMOS or NMOS more of a concern in modern transistors? What is DBIE? When...

    https://nanohub.org/resources/17249

  12. ECE 695A Lecture 22: Voltage Dependence of Thin Dielectric Breakdown

    05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    https://nanohub.org/resources/17028

  13. ECE 695A Lecture 22R: Review Questions

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    https://nanohub.org/resources/17290

  14. ECE 695A Lecture 23: Characterization of Defects Responsible for TDDB

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    https://nanohub.org/resources/17291

  15. ECE 695A Lecture 23R: Review Questions

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    https://nanohub.org/resources/17292

  16. ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Observations: Failure times are statistically distributed Models of Failure Distribution: Extrinsic vs. percolation Percolation theory of multiple Breakdown TDDB lifetime...

    https://nanohub.org/resources/17293

  17. ECE 695A Lecture 24R: Review Questions

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    https://nanohub.org/resources/17294

  18. ECE 695A Lecture 25: Theory of Soft and Hard Breakdown

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Oxide breakdowns need not be catastrophic Observations about soft vs. hard breakdown A simple model for soft/hard breakdown Interpretation of experiments Conclusions

    https://nanohub.org/resources/17295

  19. ECE 695A Lecture 25R: Review Questions

    27 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Explain why percolation resistance is area independent? Why is the physical origin of the distribution of percolation resistance? How would the ratio of hard and soft...

    https://nanohub.org/resources/17296

  20. ECE 695A Lecture 26-1: Statistics of Soft Breakdown via Methods of Markov Chains

    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Spatial vs. Temporal correlation Theory of correlated Dielectric Breakdown Excess leakage as a signature of correlated BD Conclusions

    https://nanohub.org/resources/17418

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