All Categories (101-119 of 119)

1. Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae

   Online Presentations | 27 Oct 2009 | Contributor(s):: Muhammad A. Alam

   Outline:Background: A different type of transport problem
Example: Classical biosensorsFractal dimension and cantor transformExample: fractal nanobiosensors Conclusions
Appendix: Transparent Electrodes and Antenna

2. Lecture 4: Stick Percolation and Nanonet Electronics

   Online Presentations | 26 Oct 2009 | Contributor(s):: Muhammad A. Alam

   Outline:Stick percolation and nanonet transistorsShort channel nanonet transistorsLong channel nanonet transistorsTransistors at high voltagesConclusions

3. 2009 NCN@Purdue Summer School: Electronics from the Bottom Up

   Workshops | 22 Sep 2009 | Contributor(s):: Supriyo Datta, Mark Lundstrom, Muhammad A. Alam, Joerg Appenzeller

   The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on laboratory session will be available in the afternoons.

4. Lecture 1: Percolation and Reliability of Electronic Devices

   Online Presentations | 17 Sep 2009 | Contributor(s):: Muhammad A. Alam

5. Lecture 2: Threshold, Islands, and Fractals

   Online Presentations | 17 Sep 2009 | Contributor(s):: Muhammad A. Alam

6. Lecture 3: Electrical Conduction in Percolative Systems

   Online Presentations | 17 Sep 2009 | Contributor(s):: Muhammad A. Alam

7. Nanostructured Electronic Devices: Percolation and Reliability

   Courses | 17 Sep 2009 | Contributor(s):: Muhammad A. Alam

   In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all within an unified framework of spatial and temporal percolation. The problems considered involve...

8. Jul 20 2009

   2009 NCN@Purdue Summer School: Electronics from the Bottom Up

   Electronics from the Bottom Up seeks to bring a new perspective to engineering education -- one that is designed to help realize the opportunities of nanotechnology. Ever since the birth of...

   https://nanohub.org/events/details/231

9. The Challenges of Micro-System Product Development

   Online Presentations | 05 Jun 2009 | Contributor(s):: James J. Allen

   This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

10. ECE 606 Lecture 39: Reliability of MOSFET

    0.0 out of 5 stars 

    Online Presentations | 28 Apr 2009 | Contributor(s):: Muhammad A. Alam

11. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    0.0 out of 5 stars 

    Online Presentations | 13 Mar 2009 | Contributor(s):: Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional representations of stochastic variability and to achieve exponential convergence rates in statistics...

12. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    0.0 out of 5 stars 

    Online Presentations | 14 Nov 2008 | Contributor(s):: Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

13. PRISM Seminar Series

    0.0 out of 5 stars 

    Series | 05 Nov 2008 | Contributor(s):: Jayathi Murthy, Alejandro Strachan

    Welcome to the PRISM Seminar Series.PRIMS: NNSA Center for Prediction of Reliability, Integrity and Survivability of Microsystems, is a university center funded by the Department of Energy's National Nuclear Security Administration (NNSA) under their Advanced Simulation and Computing (ASC)...

14. From density functional theory to defect level in silicon: Does the “band gap problem” matter?

    3.0 out of 5 stars 

    Online Presentations | 01 Oct 2008 | Contributor(s):: Peter A. Schultz

    Modeling the electrical effects of radiation damage in semiconductor devices requires a detailed description of the properties of point defects generated during and subsequent to irradiation. Such modeling requires physical parameters, such as defect electronic levels, to describe carrier...

15. Reliability Physics of Nanoscale Transistors

    5.0 out of 5 stars 

    Courses | 27 Nov 2007 | Contributor(s):: Muhammad A. Alam

    This course is now offered on nanoHUB as ECE 695A Reliability Physics of Nanotransistors.

16. Modeling Interface-defect Generation (MIG)

    4.0 out of 5 stars 

    Tools | 18 Jul 2006 | Contributor(s):: Ahmad Ehteshamul Islam, HALDUN KUFLUOGLU, Muhammad A. Alam

    Analyzes device reliability based on NBTI

17. ECE 695 Reliability Spring 2015

    Groups

    https://nanohub.org/groups/ece695reliability

18. ECE 695A Reliability Physics of Nanotransistors

    Courses|' 09 Jul 2014

    Instructor: Muhammad A. Alam

    https://nanohub.org/courses/ece695a

19. relHUB

    Groups

    relHUB is designed to serve the reliability community writ large, ranging from students to senior scientists and engineers, by providing worldwide access to educational resources, cutting-edge...

    https://nanohub.org/groups/reliability