Tags: Reliability physics

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  1. Time-dependent gate oxide breakdown Lab

    20 Jan 2015 | Tools | Contributor(s): Xin Jin, Muhammad Ashraful Alam, Muhammad Masuduzzaman, Sang Hoon Shin, Sambit Palit

    Simulate Time-dependent gate oxide breakdown

    https://nanohub.org/resources/tddb

  2. Husnain Al Bustam

    I am Husnain Al Bustam, graduate student in the department of Electrical and Computer Engineering, Purdue University-Calumet. I completed my Bachelor of Science in Electrical and Electronic...

    https://nanohub.org/members/89070

  3. Ankush Chaudhary

    https://nanohub.org/members/70196