Tags: scanning probe microscopy

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Description

Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.

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All Categories (1-20 of 42)

  1. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode

    14 Dec 2018 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode, Applied Surface Science, vol. 470, pp. 1122-1129, 2019 (DOI:...

    https://nanohub.org/members/112015/blog/2018/12/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  2. Mark Joseph Hagmann

    https://nanohub.org/members/202580

  3. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  4. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach

  5. Kathy Walsh

    https://nanohub.org/members/119508

  6. MATLAB-based blind tip reconstruction algorithms

    01 Aug 2014 | Contributor(s):: Erin Flater, Charles Clifford

    We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...

  7. Corrosion Mechanisms in Magnetic Recording Media

    29 Jul 2013 | Contributor(s):: Brian Demczyk

    This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.

  8. Atomic Force Microscope Investigations of Lubrication Layers

    26 Nov 2012 | | Contributor(s):: Brian Demczyk

    This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.

  9. Nanoscale Dimensions in Hard Disk Media

    27 Sep 2012 | | Contributor(s):: Brian Demczyk

    This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.

  10. Shan Yang

    https://nanohub.org/members/69536

  11. ROSHAN CHANDRA

    https://nanohub.org/members/60560

  12. Vsevolod Kosulnikov

    https://nanohub.org/members/56242

  13. Chemically Enhanced Carbon-Based Nanomaterials and Devices

    09 Nov 2010 | | Contributor(s):: Mark Hersam

    Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and biosensors. This talk will delineate chemical strategies for enhancing the electronic and optical...

  14. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    12 Apr 2010 | | Contributor(s):: Helen McNally

  15. ECET 499N Lecture 7: Scanning Probe Microscopy II

    08 Mar 2010 | | Contributor(s):: Helen McNally

  16. ECET 499N Lecture 6: Scanning Probe Microscopy I

    19 Feb 2010 | | Contributor(s):: Helen McNally

  17. ME 597 Lecture 26: Scanning Probe Nanolithography

    02 Dec 2009 | | Contributor(s):: Ron Reifenberger

    Topics:STM – early workArranging atoms with a tipLocal Oxidation Lithography (Electrochemical)Dip Pen LithographyNanografting

  18. Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications

    out of 5 stars 

    21 Sep 2009 | | Contributor(s):: andrei kolmakov

    Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with respect to available granular thin film sensors will be their size and stable, reproducible and...

  19. ECET 499N: Introduction to Nanotechnology

    out of 5 stars 

    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  20. So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?

    out of 5 stars 

    11 Sep 2008 | | Contributor(s):: Kunal Bose