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Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.
MATLAB-based blind tip reconstruction algorithms
01 Aug 2014 | Contributor(s):: Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of...
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Contributor(s):: Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | | Contributor(s):: Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.
Chemically Enhanced Carbon-Based Nanomaterials and Devices
09 Nov 2010 | | Contributor(s):: Mark Hersam
Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and biosensors. This talk will delineate chemical strategies for enhancing the electronic and optical...
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally
ECET 499N Lecture 7: Scanning Probe Microscopy II
08 Mar 2010 | | Contributor(s):: Helen McNally
ECET 499N Lecture 6: Scanning Probe Microscopy I
19 Feb 2010 | | Contributor(s):: Helen McNally
ME 597 Lecture 26: Scanning Probe Nanolithography
02 Dec 2009 | | Contributor(s):: Ron Reifenberger
Topics:STM – early workArranging atoms with a tipLocal Oxidation Lithography (Electrochemical)Dip Pen LithographyNanografting
Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications
out of 5 stars
21 Sep 2009 | | Contributor(s):: andrei kolmakov
Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with respect to available granular thin film sensors will be their size and stable, reproducible and...
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?
11 Sep 2008 | | Contributor(s):: Kunal Bose
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | | Contributor(s)::
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
SPMW Scanning Impedance Microscopy: probing local electronic structure and transport anomalies
05 Jan 2007 | | Contributor(s):: dawn bonnell
Multiple modulation SPM is a general term for a strategy that extracts information about a surface or nanostructure by combining various signals on samples and tips, using multiple frequencies to distinguish them and accessing multiple harmonics in detection. In addition to the usual...
SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution
05 Jan 2007 | | Contributor(s):: Udo D. Schwarz
Frequency modulation atomic force microscopy (FM-AFM) has been able to deliver high-resolution atomic-scale images in ultrahigh vacuum for over one decade. In addition, there have been recent reports where atomic resolution has been achieved in air and liquids using FM-AFM . Achieving...
Orbital Mediated Tunneling in a New Unimolecular Rectifier
25 May 2007 | | Contributor(s):: Robert Metzger, NCN at Northwestern University
In 1997 we showed that hexadecylquinolinium tricyanoquinodimethanide is a unimolecular rectifier, by scanning tunneling microscopy and also as a Langmuir-Blodgett (LB) monolayer, sandwiched between Al electrodes. We have now seen rectification in a new molecule: this rectification can be...
SPMW AFM at Video Rate and Beyond
16 May 2007 | | Contributor(s):: Mervyn Miles
The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional instruments in which each image requires typically a minute or more to collect. This has two major...
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
MSE 376 Lecture 11: SPM Lithography, part 3
26 Mar 2007 | | Contributor(s)::
MSE 376 Lecture 10: SPM Lithography, part 2