Tags: scanning probe microscopy

Description

Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.

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Workshops (1-1 of 1)

  1. Frontiers in Scanning Probe Microscopy

    12 Feb 2007 | Workshops

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the...

    https://nanohub.org/resources/2035