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Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.
A Primer on Scanning Tunneling Microscopy (STM)
5.0 out of 5 stars
04 Apr 2006 | Online Presentations | Contributor(s): Ron Reifenberger
Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the...
Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
0.0 out of 5 stars
10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the...
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | Online Presentations | Contributor(s): Don Bergstrom
Chemically Enhanced Carbon-Based Nanomaterials and Devices
09 Nov 2010 | Online Presentations | Contributor(s): Mark Hersam
Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries,...
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
04 Dec 2015 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | Online Presentations | Contributor(s): Helen McNally
ECET 499N Lecture 6: Scanning Probe Microscopy I
19 Feb 2010 | Online Presentations | Contributor(s): Helen McNally
ECET 499N Lecture 7: Scanning Probe Microscopy II
08 Mar 2010 | Online Presentations | Contributor(s): Helen McNally
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...
Feasibility of Molecular Manufacturing
3.0 out of 5 stars
14 Mar 2005 | Animations | Contributor(s): EPICS LSPM Team
Martin and Laura have an interesting debate about the feasibility of Molecular Manufacturing. Can molecular assemblers be developed to create new materials, new devices, and even macroscopic...
Frontiers in Scanning Probe Microscopy
30 Nov 2006 | Workshops
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the...
Haptic Interfaces to Scanning Probe Microscopy
21 Apr 2004 | Presentation Materials | Contributor(s): Daniel Wilhelm
2003 SURI Conference Proceedings
Introduction to Molecular Conduction
4.0 out of 5 stars
21 Jul 2005 | Learning Modules | Contributor(s): Ferdows Zahid, Magnus Paulsson, Avik Ghosh, Supriyo Datta
A scanning probe microscope brushes the tips of molecules rising up from a gold substrate. After making contact, the probe measures a very strange current-voltage relationship--linear portions...
MATLAB-based blind tip reconstruction algorithms
01 Aug 2014 | Downloads | Contributor(s): Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned...
ME 597 Lecture 26: Scanning Probe Nanolithography
02 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger
STM – early work
Arranging atoms with a tip
Local Oxidation Lithography (Electrochemical)
Dip Pen Lithography
Garcia, Martinez and Martinez,...
Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications
21 Sep 2009 | Online Presentations | Contributor(s): Andrei Kolmakov
Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors...
MSE 376 Lecture 10: SPM Lithography, part 2
26 Mar 2007 | Online Presentations | Contributor(s): Mark Hersam