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Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.
A Primer on Scanning Tunneling Microscopy (STM)
out of 5 stars
04 Apr 2006 | | Contributor(s):: Ron Reifenberger
Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the world-wide emergence of Nanotechnology. In this talk, the fundamental ideas behind the first scanning...
Atomic Force Microscope Investigations of Lubrication Layers
23 Nov 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 |
Chemically Enhanced Carbon-Based Nanomaterials and Devices
09 Nov 2010 | | Contributor(s):: Mark Hersam
Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and biosensors. This talk will delineate chemical strategies for enhancing the electronic and optical...
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | | Contributor(s):: Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally
ECET 499N Lecture 6: Scanning Probe Microscopy I
19 Feb 2010 | | Contributor(s):: Helen McNally
ECET 499N Lecture 7: Scanning Probe Microscopy II
08 Mar 2010 | | Contributor(s):: Helen McNally
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
Feasibility of Molecular Manufacturing
14 Mar 2005 |
Martin and Laura have an interesting debate about the feasibility of Molecular Manufacturing. Can molecular assemblers be developed to create new materials, new devices, and even macroscopic objects? Find out... If Martin ever wakes up!
Frontiers in Scanning Probe Microscopy
30 Nov 2006 |
From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world.The three day workshop featured thematically arranged invited talks. The workshop themes are broadly...
Haptic Interfaces to Scanning Probe Microscopy
21 Apr 2004 | | Contributor(s):: Daniel Wilhelm
2003 SURI Conference Proceedings
Introduction to Molecular Conduction
21 Jul 2005 | | Contributor(s):: Ferdows Zahid, Magnus Paulsson, Avik Ghosh, Supriyo Datta
A scanning probe microscope brushes the tips of molecules rising up from a gold substrate. After making contact, the probe measures a very strange current-voltage relationship--linear portions separated by flat spots or sharp increases. Definitely not Ohm's law. Is the experiment correct?...
Mark Joseph Hagmann
MATLAB-based blind tip reconstruction algorithms
20 Jun 2014 | | Contributor(s):: Erin Flater, Charles Clifford
We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of...
ME 597 Lecture 26: Scanning Probe Nanolithography
02 Dec 2009 | | Contributor(s):: Ron Reifenberger
Topics:STM – early workArranging atoms with a tipLocal Oxidation Lithography (Electrochemical)Dip Pen LithographyNanografting
Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications
21 Sep 2009 | | Contributor(s):: andrei kolmakov
Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with respect to available granular thin film sensors will be their size and stable, reproducible and...
MSE 376 Lecture 10: SPM Lithography, part 2
26 Mar 2007 |