Tags: scanning tunneling microscopy

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  1. Characterization of 2D materials at Birck Surface Analysis Facility

    28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov

    Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

  2. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  3. Nanotechnology for Aerospace Research: Surface Science Applications

    29 Mar 2016 | | Contributor(s):: Dmitry Zemlyanov

    Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...

  4. Research Article: STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite

    24 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Applied Surface Science, vol. 360, part B, pp. 451-460, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/stm-observation-of-a-box-shaped-graphene-nanostructure-appeared-after-mechanical-cleavage-of

  5. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach

  6. Kathy Walsh

    https://nanohub.org/members/119508

  7. Toai Quang Le

    https://nanohub.org/members/85714

  8. [Illinois] AVS Meeting 2012: Adsorption and Desorption of Hydrogen on Epitaxial Graphene on SiC(0001): An Ultra-High Vacuum STM Study

    04 Jun 2013 | | Contributor(s):: TeYu Chien

    With superlative physical, chemical, and electronic properties, graphene shows significant promise in a variety of technologies, including transistors, sensors, and energy conversion/storage devices.However, as an atomically thin material, graphene is highly sensitive to its environment, which...

  9. Alok Ranjan

    https://nanohub.org/members/71877

  10. Junyi Qiu

    https://nanohub.org/members/62656

  11. ME 597 Lecture 4: The Transition from STM to AFM

    09 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Recommended Reading: See References below.

  12. ME 597 Lecture 3: Advanced Topics in STM

    09 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals

  13. ME 597 Lecture 2: STM Experimental Considerations

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Early SuccessesHow to Make an STMRecommended Reading: See References below.

  14. ME 597 Lecture 1: Review of Quantum Tunneling/Introduction to STM

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Quantum TunnelingThe STM – basic ideaRecommended Reading: See References below.

  15. ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)

    01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman

    Fall 2010A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.

  16. ME 597 Lecture 6: The Transition from STM to AFM

    26 Oct 2009 | | Contributor(s):: Ron Reifenberger

  17. ME 597 Lecture 5: Some Topics in STM

    20 Oct 2009 | | Contributor(s):: Ron Reifenberger

    Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals

  18. ME 597 Lecture 4: How to Make an STM

    13 Oct 2009 | | Contributor(s):: Ron Reifenberger

    Topics:Early SuccessesHow to Make an STM

  19. ME 597 Lecture 3: Quantum Tunneling/The STM

    08 Oct 2009 | | Contributor(s):: Ron Reifenberger

    Topics:Quantum TunnelingThe STM – basic ideaRecommended Reading: See References below.

  20. ME 597 Lecture 2: Electron States in Solids-Density of States

    09 Sep 2009 | | Contributor(s):: Ron Reifenberger

    Note: This lecture has been revised since its original presentation.Topics:Electron States in Solids – Bloch FunctionsKronig-Penney ModelDensity of States