Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
22 Nov 2011 | | Contributor(s):: James Leary
See references below for related reading.14.1 Introduction to integrated designs14.1.1 “Total design” but there is some order in the design process14.1.2 A brief outline of the total design...
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
MSE 582 Lecture 10: Diffraction Contrast Imaging
out of 5 stars
13 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources
28 Jan 2008 | | Contributor(s):: Eric Stach
MSE 582 Lecture 3: Lenses, Apertures and Resolution
20 Sep 2017 | | Contributor(s):: Eric Stach
MSE 582 Lecture 4: The Instrument, Part 1
MSE 582 Lecture 4: The Instrument, Part 2
MSE 582 Lecture 6: Vacuum Science in EM
MSE 582 Lecture 7: Sample Preperation
11 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Transmission Electron Microscopy Skills
Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.
MSE 640 Lecture 11: Diffraction contrast imaging
29 May 2008 | | Contributor(s):: Eric Stach
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
MSE 640 Lecture 17: STEM Imaging
27 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 18: X-ray production in the TEM
28 May 2008 | | Contributor(s):: Eric Stach