Tags: TEM

All Categories (1-20 of 39)

  1. Himanshu Patel

    https://nanohub.org/members/198194

  2. Jan 26 2018

    Understanding the biological machinery by cryogenic TEM imaging and structure determination

    Understanding the biological machinery by cryogenic TEM imaging and structure determinationFriday, January 26, 2018 1:00:00 PM EST - 2:00:00 PM ESTLife is composed of four fundamental building...

    https://nanohub.org/events/details/1701

  3. MSE 582 Lecture 3: Lenses, Apertures and Resolution

    20 Sep 2017 | | Contributor(s):: Eric Stach

  4. Janelle P Wharry

    Dr. Wharry received her Ph.D., M.S.E. and B.S. in Nuclear Engineering & Radiological Sciences, from the University of Michigan. Prior to joining Purdue, Dr. Wharry was an Assistant Professor in...

    https://nanohub.org/members/158038

  5. QSTEM online

    01 Jul 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Volkan Ortalan

    Quantitative TEM/STEM Simulations

  6. Mahendra Ramajayam

    https://nanohub.org/members/86546

  7. Jun 06 2012

    Illinois AMC 2012 6th Advanced Materials Characterization Workshop

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...

    https://nanohub.org/events/details/350

  8. Matt Schneider

    https://nanohub.org/members/66808

  9. Kevin Grossklaus

    I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion...

    https://nanohub.org/members/60848

  10. BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems

    10 Nov 2011 | | Contributor(s):: James Leary

    See references below for related reading.14.1      Introduction to integrated designs14.1.1    “Total design” but there is some order in the design process14.1.2    A brief outline of the total design...

  11. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....

  12. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  13. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    17 Feb 2010 | | Contributor(s):: Klaus Schulten

  14. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  15. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

  16. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    29 May 2008 | | Contributor(s):: Eric Stach

  17. MSE 640 Lecture 13: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

  18. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  19. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  20. MSE 640 Lecture 11: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Thickness fringes, Bend contours, Planar faults