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Structure and Properties of Carbon and Boron Nitride Nanotubes
10 Jan 2014 | Contributor(s):: Brian Demczyk
This presentation describes structure and mechanical property determinations on carbon and boron nitride (sp2-bonded) nanotubes , as deduced by transmission electron microscopy.
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Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | Contributor(s):: Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...
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Mahendra Ramajayam
https://nanohub.org/members/86546
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Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Contributor(s):: Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
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Texture-Induced hcp c-axis Alignment in Longitudinal Media
15 Jul 2013 | Contributor(s):: Brian Demczyk
This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.
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Chi-Chin Wu
https://nanohub.org/members/68529
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Jun 06 2012
Illinois AMC 2012 6th Advanced Materials Characterization Workshop
This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...
https://nanohub.org/events/details/350
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Matt Schneider
https://nanohub.org/members/66808
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On the Two to Three Dimensional Growth Transition in Strained Silicon Germanium Thin Films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
Utilizing a model adapted from classical nucleation theory [8], we calculate a "critical thickness" for island formation, taking into account the surfaceenergies of the deposit and the substrate and the elastic modulus of the deposit, to which experimental results for CVD grown silicon germanium...
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Boron Nitride Nanotube Growth Mode
27 Jan 2012 | | Contributor(s):: Brian Demczyk
This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques.This research was supported in part by the Director of the Office of...
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Kevin Grossklaus
I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion beam...
https://nanohub.org/members/60848
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BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
22 Nov 2011 | | Contributor(s):: James Leary
See references below for related reading.14.1 Introduction to integrated designs14.1.1 “Total design” but there is some order in the design process14.1.2 A brief outline of the total design...
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Wen Jiang
Dr. Jiang’s primary appointment is a Professor in the Department of Biological Sciences at Purdue University. He is also the scientific director of the Purdue Cryo-EM Facility. In addition, he has...
https://nanohub.org/members/54400
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TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....
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ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
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Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | | Contributor(s):: Klaus Schulten
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ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
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MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
29 May 2008 | | Contributor(s):: Eric Stach
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MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
29 May 2008 | | Contributor(s):: Eric Stach
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MSE 640 Lecture 13: Diffraction contrast imaging
29 May 2008 | | Contributor(s):: Eric Stach
Weak beam dark field imaging, Simulation of diffraction contrast