X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the physical and chemical properties of a material's surface. XPS uses a beam of X-rays to irradiate the material while simultaneously measuring the kinetic energy (KE) and the number of electrons that escape from within the top 10 to 12 nm of the material being analyzed. The resulting spetra of number of electrons vs. the kinetic energy is used to identify the elements present on the surface of the material being analyzed. For a more extensive description of XPS see WIkipedia.
Learn more about XPS from the resources on this site, listed below.
Mystery Molecules: Identifying Materials with Nanoscale Characterization Tools
18 Mar 2020 | | Contributor(s):: Maude Cuchiara, NNCI Nano
In this lesson plan, students will be given several similar looking materials and asked to identify them by observing them at the macro and micro-scale. They will then be exposed to different analytical tools and describe how they can be used to explore materials at the nanoscale. ...
X-Ray Photoelectron Spectroscopy (XPS)
18 Sep 2018 | | Contributor(s):: Hamed Simchi, NACK Network
OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling
Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
Nanotechnology for Aerospace Research: Surface Science Applications
29 Mar 2016 | | Contributor(s):: Dmitry Zemlyanov
Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...
[Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1
18 Aug 2015 | | Contributor(s):: Rick Haasch
[Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2
Surface structure and composition of high-surface-area molybdenum nitrides
02 Feb 2012 | | Contributor(s):: Brian Demczyk, j. G. Choi, L. T. Thompson
In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.
XPS Thickness Solver
18 Dec 2011 | | Contributor(s):: Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
10 Nov 2011 | | Contributor(s):: James Leary
See references below for related reading.14.1 Introduction to integrated designs14.1.1 “Total design” but there is some order in the design process14.1.2 A brief outline of the total design...
BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications
01 Nov 2011 | | Contributor(s):: Dmitry Zemlyanov
Guest lecturer: Dmitry Zemlyanov
Sep 22 2010
Introduction to XPS: What you should know about X-ray photoelectron spectroscopy?
ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis
04 Mar 2010 | | Contributor(s):: Dmitry Zemlyanov
Guest Lecturer: Dmitry Zemlyanov
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
30 Jan 2010 | | Contributor(s):: Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...
Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications
out of 5 stars
21 Sep 2009 | | Contributor(s):: andrei kolmakov
Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with respect to available granular thin film sensors will be their size and stable, reproducible and...
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...