Tags: X-Ray Photoelectron Spectroscopy (XPS)


X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the physical and chemical properties of a material's surface. XPS uses a beam of X-rays to irradiate the material while simultaneously measuring the kinetic energy (KE) and the number of electrons that escape from within the top 10 to 12 nm of the material being analyzed. The resulting spetra of number of electrons vs. the kinetic energy is used to identify the elements present on the surface of the material being analyzed. For a more extensive description of XPS see WIkipedia.

Learn more about XPS from the resources on this site, listed below.

All Categories (1-20 of 34)

  1. Introduction to X-ray Diffraction (XRD)

    Online Presentations | 02 Dec 2022 | Contributor(s):: Peter Kazarinoff, NACK Network

  2. X-ray Diffraction (XRD) Part 2

    Online Presentations | 18 Nov 2022 | Contributor(s):: Atilla Ozgur Cakmak, NACK Network

  3. World of Light

    Online Presentations | 22 Sep 2022 | Contributor(s):: Atilla Ozgur Cakmak, The Micro Nano Technology - Education Center

    In this presentation, World of Light, Atilla Ozgur Cakmak, Assistant Professor at Grand Valley State University, explains Photonics and more.

  4. Mystery Molecules: Identifying Materials with Nanoscale Characterization Tools

    Teaching Materials | 18 Mar 2020 | Contributor(s):: Maude Cuchiara, NNCI Nano

     In this lesson plan, students will be given several similar looking materials and asked to identify them by observing them at the macro and micro-scale. They will then be exposed to different analytical tools and describe how they can be used to explore materials at the nanoscale. ...

  5. Farhana Twaha


  6. X-Ray Photoelectron Spectroscopy (XPS)

    Online Presentations | 18 Sep 2018 | Contributor(s):: Hamed Simchi, NACK Network

    OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling

  7. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    Online Presentations | 20 Jul 2018 | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves



  9. Characterization of 2D materials at Birck Surface Analysis Facility

    Online Presentations | 28 Sep 2016 | Contributor(s):: Dmitry Zemlyanov

    Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

  10. Nanotechnology for Aerospace Research: Surface Science Applications

    Online Presentations | 29 Mar 2016 | Contributor(s):: Dmitry Zemlyanov

    Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...

  11. Federico Gramazio


  12. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1

    Online Presentations | 18 Aug 2015 | Contributor(s):: Rick Haasch

  13. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2

    Online Presentations | 18 Aug 2015 | Contributor(s):: Rick Haasch

  14. Filippo Mangolini


  15. David Morgan


  16. Surface structure and composition of high-surface-area molybdenum nitrides

    Papers | 02 Feb 2012 | Contributor(s):: Brian Demczyk, j. G. Choi, L. T. Thompson

    In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.

  17. Christian Emanuelsson


  18. XPS Thickness Solver

    Tools | 18 Dec 2011 | Contributor(s):: Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin

    Helps the user to determine the thickness of an overlayer material from XPS experiment data.

  19. BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems

    Online Presentations | 10 Nov 2011 | Contributor(s):: James Leary

    See references below for related reading.14.1      Introduction to integrated designs14.1.1    “Total design” but there is some order in the design process14.1.2    A brief outline of the total design...

  20. BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications

    Online Presentations | 01 Nov 2011 | Contributor(s):: Dmitry Zemlyanov

    Guest lecturer: Dmitry Zemlyanov