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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.
Addressing Molecular Dynamics Time-scale Issues to Study Atomic-scale Friction
12 Oct 2010 | | Contributor(s):: Ashlie Martini
This presentation will include an introduction to several accelerated molecular dynamics methods. However, particular focus will be given to parallel replica (ParRep) dynamics in which atomistic simulations are run parallel in time to extend their total duration. The ParRep method is based on...
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
AFM Sample Preparation in Biology
03 May 2011 | | Contributor(s):: Irene Revenko
All biological samples are different, the key is to start with established recipes for similar samples, then adapt the procedures for a different one. We'll present guidelines for choosing a substrate, immobilizing the sample, choosing the proper cantilever, as well as tips and tricks optimize...
Atomic Force Microscopy
out of 5 stars
01 Dec 2005 | | Contributor(s):: Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the...
Atomic Force Microscopy: Applications for Life Science Research
21 Mar 2011 | | Contributor(s):: Irene Revenko
This presentation presents the principles of AFM and demonstrates the applications in Life Sciences. We will also discuss key points about the technology, and more particularly, the technical characteristics you should understand when using an AFM such as noise level, limitations of the...
BME 695L Special Lecture 4: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
02 Dec 2011 | | Contributor(s):: Helen McNally
Guest lecturer: Helen McNally
BME 695N Lecture 9: Atomic Force Microscopy (AFM) for Nanomedical Systems (cells and nanoparticles)
30 Sep 2007 | | Contributor(s):: Helen McNally
What Helen McNally as guest lecturer.
BNC Annual Research Symposium: Metrology and Nanomaterials Characterization
10 May 2007 | | Contributor(s):: Ron Reifenberger
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.
BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers
04 Jun 2008 | | Contributor(s)::
ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)
12 Apr 2010 | | Contributor(s):: Helen McNally
Electronic Characterization of Materials Using Conductive AFM
03 May 2011 | | Contributor(s):: Amir Moshar
Force Measurements in AFM
Gas Damping of Microcantilevers at Low Ambient Pressures
03 Nov 2008 | | Contributor(s):: Rahul Anil Bidkar
This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a...
Illinois 2011 NanoBiophotonics Summer School: Poster Day: Peng Huang
29 Nov 2011 | | Contributor(s):: Peng Huang, Nadia Jassim
Local raster scanning of high speed imaging of polymers in atomic force microscopy.
Illinois ME 498 Introduction of Nano Science and Technology, Lecture 20: Sensing and Actuation in Nanoscale
17 Dec 2009 | | Contributor(s):: Nick Fang, Omar N Sobh
Sensing and Actuation in NanoscaleTopics: Scanning Tunneling Microscopy Two Modes of Forming STM Images STM Manipulation Atomic Force Microscopy Typical Engaging Curve Imaging in Fluid Shear Force Sensing by Tuning Fork Tip Shape Effects: Containment Tip Shape Effect: Cone Angle Other Imaging...
Introduction to Birck Scanning Probe Microscopy Center
03 May 2011 | | Contributor(s):: Xin Xu
This presentation gives an introduction to the AFM facility and AFM related research being conducted in Birck nanotechnology center (BNC), and also some useful AFM resources.
ME 597 Course Overview
01 Sep 2010 | | Contributor(s):: Ron Reifenberger
ME 597 Introductory Lecture
01 Sep 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 10: Force Distance Curves II
11 Oct 2010 | | Contributor(s):: Arvind Raman
17 Feb 2010 | | Contributor(s):: Arvind Raman