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By Xin Jin1, Muhammad Ashraful Alam2, Muhammad Masuduzzaman1, Sang Hoon Shin1, Sambit Palit1
1. Purdue University 2. Lucent Technologies
Simulate Time-dependent gate oxide breakdown
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Version 1.0 - published on 20 Jan 2015
doi:10.4231/D3JD4PQ3W cite this
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