Tags: atomic force microscopy (AFM)

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Description

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Learn more about quantum dots from the many resources on this site, listed below. More information on AFM can be found here.

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  1. Carbon Nanotube Counter

    08 Aug 2018 | Contributor(s):: Quinn Lennemann

    Carbon Nanotube Counter (CNT Counter) is a program that can count the density of Carbon Nanotubes in microscope scans. The program supports JPEG and TIFF images from both Scanning Electron Microscopes (SEMs) and Atomic Force Microscopes (AFMs). This program contains both an automatic mode and a...

  2. MATLAB-based blind tip reconstruction algorithms

    01 Aug 2014 | Contributor(s):: Erin Flater, Charles Clifford

    We are making available for download our MATLAB-based blind tip reconstruction algorithms. These algorithms are based on the code published in J. Villarrubia, "Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation", Journal of Research...